*4.6. XRD Analysis*

An Brüker D8 Advance X-ray diffractometer instrument (Brüker, Analytical Instruments, S.A., Athens, Greece) was used for XRD measurements on ALG/G, ALG/G/NZ, and ALG/G/TO@NZ active films, as well as on NZ and TO@NZ hybrid nanostructure powders. The instrument was equipped with a LINXEYE XE High-Resolution Energy-Dispersive detector, and the measurements were carried out in the range 2θ = 0.5–30◦ and with an increment of 0.03.
