*4.10. X-ray Diffraction (XRD) Analysis*

The percentage of crystallinity of the samples was recorded by an X-ray diffractometer (Bruker D8 Discover, Billerica, MA, USA) running with copper (Kα) radiation (1.5418 Å), 40 kV. Samples were analyzed between 2θ = 5◦ and 2θ = 50◦ at the rate of 0.500 s/point.
