*4.7. SEM Images*

The surface and cross-section morphology of CS/PVOH/HNT and CS/PVOH/ TO@HNT films was recorded by using a JEOL JSM-6510 LV SEM (Microscope Ltd., Tokyo, Japan) were used equipped with an X-Act EDS-detector by Oxford Instruments, Abingdon, Oxfordshire, UK (an acceleration voltage of 20 kV was applied).
