*4.8. X-ray Diffraction (XRD) Analysis*

To determine the crystallinity of the samples, X-ray diffractometer (Bruker D8 Discover) was used by applying 40 kV voltage with 2 theta ranging from 5–50◦ at a rate of 0.500 s/point, employing copper (Kα) radiation (1.5418 Å).
