Optical In-Process Measurement Systems

doi:10.3390/books978-3-0365-3850-1

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Hardback

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Keywords

speckle photography; in-process measurement; deep rolling process; generalized phase shifting interferometry; dual-aperture common-path interferometer; real-time optical instrumentation; optomechatronic systems; electrical steel; optical coherence tomography; OCT; scanning; process monitoring; laser material processing; spot compensation; low coherence interferometry; LCI; wind lidar; Doppler lidar; bistatic; metrology; traceability; wind energy; meteorology; diffraction grating; grating pitch; mode-locked femtosecond laser; laser diffraction; diffraction equation; measurement uncertainty analysis; image processing; pattern recognition; wind energy turbines; turbulence wedges; coherence scanning interferometry; in-process application; Mirau interferometer; vibration compensation; interferometric distance sensor; optical path length modulation; oscillating reference mirror; hairpin; laser welding; semantic segmentation; dilated convolution; sdu-net; spatter detection; quality assurance; fast prediction time; in-process measurement; in situ measurement; optical metrology; quality control; interferometry; fringe projection; computational shear interferometry; coherence function; structure function; additive manufacturing; medium voltage switchgear; SF₆ alternatives; UV-Vis spectroscopy; gas mixing modeling; multicomponent diffusion analysis; explosion; coal dust; methane; explosion suppression; spectral characteristics; explosion pressure; radiation intensity; free radicals; n/a

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Optical In-Process Measurement Systems

Edited by

May 2022

194 pages

ISBN978-3-0365-3849-5 (Hardback)
ISBN978-3-0365-3850-1 (PDF)

https://doi.org/10.3390/books978-3-0365-3850-1

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This is a Reprint of the Special Issue Optical In-Process Measurement Systems that was published in

Biology & Life Sciences

Chemistry & Materials Science

Computer Science & Mathematics

Engineering

Environmental & Earth Sciences

Physical Sciences

Summary

Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications.