Near-Fault Seismic Hazard Characterization and Risk Assessment of Structures

Dear Colleagues,

Due to the complex earthquake effects such as directivity, fling-step and hanging-wall, near-fault ground motions possess unique characteristics of long-period velocity pulses, substantial residual displacements and high-amplitude vertical components, which are highly damaging to structures and bring significant challenges to their resilience and long-term sustainability. Although extensive seismic damage is well-recognized, the scarcity of recorded near-fault motions imposes severe limitations on the study of near-fault effects on dynamic structural responses, hindering a full and comprehensive understanding of the regional variability and distribution of ground motions, and corresponding seismic risk of structures. With the ever-increasing strong motion data pool and earthquake damage experience from recent major earthquakes, continued rapid advancements in physics-based earthquake ground motion simulations, more rigorous structural analysis and experiments, and advanced methods to improve seismic resilience, the understanding of near-fault effects on dynamic structural responses is being steadily improved. This special issue aims to attract global researchers to contribute to near-fault seismic hazards and seismic risk of structures in order to improve seismic performance of near-fault structures. In this special issue, original research articles and reviews are welcome. The topics of particular interest include, but are not limited to: With the

• Earthquake damage investigation
• Near-fault seismic hazard characterization
• Seismic site behavior of near-fault regions
• Seismic performance evaluation of near-fault structures
• Seismic design and retrofit of near-fault structures
• Seismic resilience of near-fault structures
• Seismic isolation
• Near-fault risk assessment of structures
• Regional risk evaluation of structures with near-fault effects
• Climate change on near-fault effects
• Seismic sustainability of structures accounting for near-fault effects

I/We look forward to receiving your contributions.

Dr. Suiwen Wu
Dr. Xiaowei Wang
Dr. Nailiang Xiang
Dr. Chen Xu
Dr. Ram K. Mazumder
Guest Editors

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