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Article

Tunable Fabry-Perot Interferometer Designed for Far-Infrared Wavelength by Utilizing Electromagnetic Force

1
School of Electronics Engineering, College of IT Engineering, Kyungpook National University, Daegu 41566, Korea
2
Aircraft System Technology Group, Korea Institute of Industrial Technology (KITECH), Daegu 42994, Korea
3
Department of Sensor and Display Engineering, Kyungpook National University, Daegu 41566, Korea
*
Authors to whom correspondence should be addressed.
Sensors 2018, 18(8), 2572; https://doi.org/10.3390/s18082572
Submission received: 28 May 2018 / Revised: 30 July 2018 / Accepted: 3 August 2018 / Published: 6 August 2018
(This article belongs to the Special Issue Infrared Sensors and Technologies)

Abstract

A tunable Fabry-Perot interferometer (TFPI)-type wavelength filter designed for the long-wavelength infrared (LWIR) region is fabricated using micro electro mechanical systems (MEMS) technology and the novel polydimethylsiloxane (PDMS) micro patterning technique. The structure of the proposed infrared sensor consists of a Fabry-Perot interferometer (FPI)-based optical filter and infrared (IR) detector. An amorphous Si-based thermal IR detector is located under the FPI-based optical filter to detect the IR-rays filtered by the FPI. The filtered IR wavelength is selected according to the air etalon gap between reflectors, which is defined by the thickness of the patterned PDMS. The 8 μm-thick PDMS pattern is fabricated on a 3 nm-thick Al layer used as a reflector. The air etalon gap is changed using the electromagnetic force between the permanent magnet and solenoid. The measured PDMS gap height is about 2 μm, ranging from 8 μm to 6 μm, with driving current varying from 0 mA to 600 mA, resulting in a tunable wavelength range of 4 μm. The 3-dB bandwidth (full width at half maximum, FWHM) of the proposed filter is 1.5 nm, while the Free Spectral Range (FSR) is 8 μm. Experimental results show that the proposed TFPI can detect a specific wavelength at the long LWIR region.
Keywords: FPI; IR detector; optical filter FPI; IR detector; optical filter

Share and Cite

MDPI and ACS Style

Jung, D.G.; Lee, J.Y.; Kim, J.K.; Jung, D.; Kong, S.H. Tunable Fabry-Perot Interferometer Designed for Far-Infrared Wavelength by Utilizing Electromagnetic Force. Sensors 2018, 18, 2572. https://doi.org/10.3390/s18082572

AMA Style

Jung DG, Lee JY, Kim JK, Jung D, Kong SH. Tunable Fabry-Perot Interferometer Designed for Far-Infrared Wavelength by Utilizing Electromagnetic Force. Sensors. 2018; 18(8):2572. https://doi.org/10.3390/s18082572

Chicago/Turabian Style

Jung, Dong Geon, Jun Yeop Lee, Jae Keon Kim, Daewoong Jung, and Seong Ho Kong. 2018. "Tunable Fabry-Perot Interferometer Designed for Far-Infrared Wavelength by Utilizing Electromagnetic Force" Sensors 18, no. 8: 2572. https://doi.org/10.3390/s18082572

APA Style

Jung, D. G., Lee, J. Y., Kim, J. K., Jung, D., & Kong, S. H. (2018). Tunable Fabry-Perot Interferometer Designed for Far-Infrared Wavelength by Utilizing Electromagnetic Force. Sensors, 18(8), 2572. https://doi.org/10.3390/s18082572

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