Veale, M.C.; Booker, P.; Cross, S.; Hart, M.D.; Jowitt, L.; Lipp, J.; Schneider, A.; Seller, P.; Wheater, R.M.; Wilson, M.D.;
et al. Characterization of the Uniformity of High-Flux CdZnTe Material. Sensors 2020, 20, 2747.
https://doi.org/10.3390/s20102747
AMA Style
Veale MC, Booker P, Cross S, Hart MD, Jowitt L, Lipp J, Schneider A, Seller P, Wheater RM, Wilson MD,
et al. Characterization of the Uniformity of High-Flux CdZnTe Material. Sensors. 2020; 20(10):2747.
https://doi.org/10.3390/s20102747
Chicago/Turabian Style
Veale, Matthew Charles, Paul Booker, Simon Cross, Matthew David Hart, Lydia Jowitt, John Lipp, Andreas Schneider, Paul Seller, Rhian Mair Wheater, Matthew David Wilson,
and et al. 2020. "Characterization of the Uniformity of High-Flux CdZnTe Material" Sensors 20, no. 10: 2747.
https://doi.org/10.3390/s20102747
APA Style
Veale, M. C., Booker, P., Cross, S., Hart, M. D., Jowitt, L., Lipp, J., Schneider, A., Seller, P., Wheater, R. M., Wilson, M. D., Hansson, C. C. T., Iniewski, K., Marthandam, P., & Prekas, G.
(2020). Characterization of the Uniformity of High-Flux CdZnTe Material. Sensors, 20(10), 2747.
https://doi.org/10.3390/s20102747