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Journal: Sensors, 2020
Volume: 20
Number: 6620

Article: Reduction of Dark Current in CMOS Image Sensor Pixels Using Hydrocarbon-Molecular-Ion-Implanted Double Epitaxial Si Wafers
Authors: by Ayumi Onaka-Masada, Takeshi Kadono, Ryosuke Okuyama, Ryo Hirose, Koji Kobayashi, Akihiro Suzuki, Yoshihiro Koga and Kazunari Kurita
Link: https://www.mdpi.com/1424-8220/20/22/6620

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