A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network
Abstract
:1. Introduction
- (1)
- The long time-series line trip fault prediction method using the improved stacked-Informer network is adopted; it exploits more comprehensive temporal information of long sequence input measurement data, includes normal and abnormal current and voltage data of power lines, and then predicts the short sequence output fault. This method achieves a superior generalization performance.
- (2)
- The strategy of gradient centralization (GC) technology is introduced and embedded into the optimizer, replacing the original Adam optimizer usually used in the DNN model for a GC+Adam optimization. GC can be viewed as a projected gradient descent method with a constrained loss function; it operates directly on gradients by centralizing the gradient vectors in order to have zero means. This technology improves the training time of the long sequence time-series fault prediction markedly and improves the accuracy and efficiency of the presented methodology.
- (3)
- Real measurement long sequence data is collected by electrical sensors at a wind solar hybrid power station, which is located in Zhangjiakou City, China. The recorded long sequence data is divided into two datasets, and both of them are conducted on the proposed methodology in order to prove a superior performance in real-scenario application.
2. Related Work
3. The Proposed Methodology of Long Sequence Time-Series Fault Prediction
3.1. Architecture
3.2. The Improved GC + Adam Optimizer
4. Evaluated Experiments
4.1. Data Description and Experimental Setting
4.2. Different Optimizer Validation
4.3. Comparative Results of the Presented Method and the Original Informer Network
4.4. Comparative Result of the Different Lengths of the Prediction Output Sequence
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Conflicts of Interest
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Parameters | Value |
---|---|
Length of input sequence | 200 |
Length of predicting short sequence | 50 |
Batch size | 32 |
Learning rate | 0.0001 |
Dropout rate | 0.05 |
Decay | 0.001 |
Datasets | A | B | C | D |
---|---|---|---|---|
Dataset 1 | 885.26 | 538.86 | 539.23 | 384.85 |
Dataset 2 | 381.52 | 267.26 | 572.89 | 496.34 |
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Guo, L.; Li, R.; Jiang, B. A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network. Sensors 2021, 21, 4466. https://doi.org/10.3390/s21134466
Guo L, Li R, Jiang B. A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network. Sensors. 2021; 21(13):4466. https://doi.org/10.3390/s21134466
Chicago/Turabian StyleGuo, Li, Runze Li, and Bin Jiang. 2021. "A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network" Sensors 21, no. 13: 4466. https://doi.org/10.3390/s21134466
APA StyleGuo, L., Li, R., & Jiang, B. (2021). A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network. Sensors, 21(13), 4466. https://doi.org/10.3390/s21134466