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Journal: Sensors, 2023
Volume: 23
Number: 5725

Article: Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon—Electronic Properties of Configurational Transformations
Authors: by Andrei Nitescu, Cristina Besleaga, George Alexandru Nemnes and Ioana Pintilie
Link: https://www.mdpi.com/1424-8220/23/12/5725

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