Next Article in Journal
Defect Inspection Using Modified YoloV4 on a Stitched Image of a Spinning Tool
Previous Article in Journal
An Area-Efficient up/down Double-Sampling Circuit for a LOFIC CMOS Image Sensor
Previous Article in Special Issue
Simulation Analysis of a Wavefront Reconstruction of a Large Aperture Laser Beam
 
 
Article

Article Versions Notes

Sensors 2023, 23(9), 4482; https://doi.org/10.3390/s23094482
Action Date Notes Link
article pdf uploaded. 4 May 2023 14:56 CEST Version of Record https://www.mdpi.com/1424-8220/23/9/4482/pdf-vor
article xml uploaded. 5 May 2023 10:36 CEST Original file https://www.mdpi.com/1424-8220/23/9/4482/xml
article pdf uploaded. 5 May 2023 10:36 CEST Updated version of record https://www.mdpi.com/1424-8220/23/9/4482/pdf
article html file updated 5 May 2023 10:37 CEST Original file https://www.mdpi.com/1424-8220/23/9/4482/html
Back to TopTop