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Journal: Sensors, 2024
Volume: 24
Number: 5116

Article: A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and Quality in the Wafer Probing Process for Semiconductor Manufacturing
Authors: by Woonyoung Yeo, Yung-Chia Chang, Liang-Ching Chen and Kuei-Hu Chang
Link: https://www.mdpi.com/1424-8220/24/16/5116

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