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Journal: Sensors, 2024
Volume: 24
Number: 5157

Article: Hybrid Bright-Dark-Field Microscopic Fringe Projection System for Cu Pillar Height Measurement in Wafer-Level Package
Authors: by Dezhao Wang, Weihu Zhou, Zili Zhang and Fanchang Meng
Link: https://www.mdpi.com/1424-8220/24/16/5157

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