Liu, Y.; Li, H.; Yu, K.; Zhu, H.; Zhang, B.; Wu, W.; Mu, H.
Cgc-YOLO: A New Detection Model for Defect Detection of Tea Tree Seeds. Sensors 2025, 25, 5446.
https://doi.org/10.3390/s25175446
AMA Style
Liu Y, Li H, Yu K, Zhu H, Zhang B, Wu W, Mu H.
Cgc-YOLO: A New Detection Model for Defect Detection of Tea Tree Seeds. Sensors. 2025; 25(17):5446.
https://doi.org/10.3390/s25175446
Chicago/Turabian Style
Liu, Yuwen, Hao Li, Kefan Yu, Hui Zhu, Binjie Zhang, Wangyu Wu, and Hongbo Mu.
2025. "Cgc-YOLO: A New Detection Model for Defect Detection of Tea Tree Seeds" Sensors 25, no. 17: 5446.
https://doi.org/10.3390/s25175446
APA Style
Liu, Y., Li, H., Yu, K., Zhu, H., Zhang, B., Wu, W., & Mu, H.
(2025). Cgc-YOLO: A New Detection Model for Defect Detection of Tea Tree Seeds. Sensors, 25(17), 5446.
https://doi.org/10.3390/s25175446