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Journal: Sensors, 2025
Volume: 25
Number: 1532
Article:
Single-Model Self-Recovering Fringe Projection Profilometry Absolute Phase Recovery Method Based on Deep Learning
Authors:
by
Xu Li, Yihao Shen, Qifu Meng, Mingyi Xing, Qiushuang Zhang and Hualin Yang
Link:
https://www.mdpi.com/1424-8220/25/5/1532
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