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Journal: Sensors, 2008
Volume: 8
Number: 3345

Article: Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating
Authors: by Byoung Chul Kim, Young Gun Heo, Yong Kweon Suh and Young Han Kim
Link: https://www.mdpi.com/1424-8220/8/5/3345

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