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Journal: Micromachines, 2021
Volume: 12
Number: 328

Article: Retention Enhancement in Low Power NOR Flash Array with High-κ–Based Charge-Trapping Memory by Utilizing High Permittivity and High Bandgap of Aluminum Oxide
Authors: by Young Suh Song and Byung-Gook Park
Link: https://www.mdpi.com/2072-666X/12/3/328

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