Zhang, X.; Liu, Y.; Xu, C.; Liao, X.; Chen, D.; Yang, Y.
A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits. Micromachines 2023, 14, 1887.
https://doi.org/10.3390/mi14101887
AMA Style
Zhang X, Liu Y, Xu C, Liao X, Chen D, Yang Y.
A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits. Micromachines. 2023; 14(10):1887.
https://doi.org/10.3390/mi14101887
Chicago/Turabian Style
Zhang, Xiaorui, Yi Liu, Changqing Xu, Xinfang Liao, Dongdong Chen, and Yintang Yang.
2023. "A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits" Micromachines 14, no. 10: 1887.
https://doi.org/10.3390/mi14101887
APA Style
Zhang, X., Liu, Y., Xu, C., Liao, X., Chen, D., & Yang, Y.
(2023). A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits. Micromachines, 14(10), 1887.
https://doi.org/10.3390/mi14101887