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Journal: Micromachines, 2025
Volume: 16
Number: 119
Article:
Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing
Authors:
by
Muhammad A. Butt, Lukasz Kozlowski, Mateusz Słowikowski, Marcin Juchniewicz, Dagmara Drecka, Maciej Filipiak, Michał Golas, Bartłomiej Stonio, Michal Dudek and Ryszard Piramidowicz
Link:
https://www.mdpi.com/2072-666X/16/2/119
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