Huang, C.-H.; Lee, P.-H.; Chang, S.-H.; Kuo, H.-C.; Sun, C.-W.; Lin, C.-C.; Tsai, C.-L.; Liu, X.
Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals 2021, 11, 1048.
https://doi.org/10.3390/cryst11091048
AMA Style
Huang C-H, Lee P-H, Chang S-H, Kuo H-C, Sun C-W, Lin C-C, Tsai C-L, Liu X.
Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals. 2021; 11(9):1048.
https://doi.org/10.3390/cryst11091048
Chicago/Turabian Style
Huang, Che-Hsuan, Pei-Hsuan Lee, Shu-Hsiu Chang, Hao-Chung Kuo, Chia-Wei Sun, Chien-Chung Lin, Chun-Lin Tsai, and Xinke Liu.
2021. "Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network" Crystals 11, no. 9: 1048.
https://doi.org/10.3390/cryst11091048
APA Style
Huang, C.-H., Lee, P.-H., Chang, S.-H., Kuo, H.-C., Sun, C.-W., Lin, C.-C., Tsai, C.-L., & Liu, X.
(2021). Automated Optical Inspection Method for Light-Emitting Diode Defect Detection Using Unsupervised Generative Adversarial Neural Network. Crystals, 11(9), 1048.
https://doi.org/10.3390/cryst11091048