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Nanomaterials
Volume 12
Issue 10
10.3390/nano12101721
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Journal: Nanomaterials, 2022
Volume: 12
Number: 1721

Article: Novel Modeling Approach to Analyze Threshold Voltage Variability in Short Gate-Length (15–22 nm) Nanowire FETs with Various Channel Diameters
Authors: by Seunghwan Lee, Jun-Sik Yoon, Junjong Lee, Jinsu Jeong, Hyeok Yun, Jaewan Lim, Sanguk Lee and Rock-Hyun Baek
Link: https://www.mdpi.com/2079-4991/12/10/1721

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