Peverini, F.; Bizzarri, M.; Boscardin, M.; Calcagnile, L.; Caprai, M.; Caricato, A.P.; Cirrone, G.A.P.; Crivellari, M.; Cuttone, G.; Dunand, S.;
et al. High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials 2022, 12, 3466.
https://doi.org/10.3390/nano12193466
AMA Style
Peverini F, Bizzarri M, Boscardin M, Calcagnile L, Caprai M, Caricato AP, Cirrone GAP, Crivellari M, Cuttone G, Dunand S,
et al. High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials. 2022; 12(19):3466.
https://doi.org/10.3390/nano12193466
Chicago/Turabian Style
Peverini, Francesca, Marco Bizzarri, Maurizio Boscardin, Lucio Calcagnile, Mirco Caprai, Anna Paola Caricato, Giuseppe Antonio Pablo Cirrone, Michele Crivellari, Giacomo Cuttone, Sylvain Dunand,
and et al. 2022. "High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices" Nanomaterials 12, no. 19: 3466.
https://doi.org/10.3390/nano12193466
APA Style
Peverini, F., Bizzarri, M., Boscardin, M., Calcagnile, L., Caprai, M., Caricato, A. P., Cirrone, G. A. P., Crivellari, M., Cuttone, G., Dunand, S., Fanò, L., Gianfelici, B., Hammad, O., Ionica, M., Kanxheri, K., Large, M., Maruccio, G., Menichelli, M., Monteduro, A. G.,
... Pedio, M.
(2022). High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials, 12(19), 3466.
https://doi.org/10.3390/nano12193466