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Journal: Nanomaterials, 2023
Volume: 13
Number: 2407

Article: Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
Authors: by Dorian Minkov, George Angelov, Emilio Marquez, Rossen Radonov, Rostislav Rusev, Dimitar Nikolov and Susana Ruano
Link: https://www.mdpi.com/2079-4991/13/17/2407

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