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Correction

Correction: Klauser et al. Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale. Nanomaterials 2022, 12, 369

by
Waldemar Klauser
*,
Fabian T. von Kleist-Retzow
and
Sergej Fatikow
Division Microrobotics and Control Engineering, Department of Computing Science, University of Oldenburg, D-26129 Oldenburg, Germany
*
Author to whom correspondence should be addressed.
Nanomaterials 2023, 13(21), 2847; https://doi.org/10.3390/nano13212847
Submission received: 16 June 2023 / Revised: 18 July 2023 / Accepted: 8 September 2023 / Published: 27 October 2023

1. Text Correction

There was an unclear passage in the original publication [1]. The value of the line tension is actually negative. This is clearly seen in Figure 3b. While it is implicit, we would like to point out that the value of the line tension we give is an absolute value, and we would like to add a minus to the value range extracted from Figure 3b.
A correction has been made to “Section 3, Results”:
“From this fit, we determined an absolute value for the apparent line tension, τ = 4.02 × 10−7 J/m. Furthermore, for better display of the validity of the measurement results, θC versus one divided by the radius of the spheres was plotted too (see Figure 3b). The solid red line corresponds to the previously determined τ. The two additional dotted lines correspond to 2 τ and 1/2 τ. Thus, more than 90% of the data points are located in the funnel that spans between −8.04 × 10−7 J/m < τ < −2.01 × 10−7 J/m.”

2. Reference Correction

In the original publication, Ref. [22] was not cited correctly, it should change as follows:
New Ref. 22: Zhao, B.; Luo, S.; Bonaccurso, E.; Auernhammer, G.K.; Deng, X.; Li, Z.; Chen, L. Resolving the Apparent Line Tension of Sessile Droplets and Understanding its Sign Change at a Critical Wetting Angle. Phys. Rev. Lett. 2019, 123, 94501
The authors apologize for any inconvenience caused and state that the scientific conclusions are unaffected. This correction was approved by the Academic Editor. The original publication has also been updated.

Reference

  1. Klauser, W.; von Kleist-Retzow, F.T.; Fatikow, S. Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale. Nanomaterials 2022, 12, 369. [Google Scholar] [CrossRef] [PubMed]
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MDPI and ACS Style

Klauser, W.; von Kleist-Retzow, F.T.; Fatikow, S. Correction: Klauser et al. Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale. Nanomaterials 2022, 12, 369. Nanomaterials 2023, 13, 2847. https://doi.org/10.3390/nano13212847

AMA Style

Klauser W, von Kleist-Retzow FT, Fatikow S. Correction: Klauser et al. Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale. Nanomaterials 2022, 12, 369. Nanomaterials. 2023; 13(21):2847. https://doi.org/10.3390/nano13212847

Chicago/Turabian Style

Klauser, Waldemar, Fabian T. von Kleist-Retzow, and Sergej Fatikow. 2023. "Correction: Klauser et al. Line Tension and Drop Size Dependence of Contact Angle at the Nanoscale. Nanomaterials 2022, 12, 369" Nanomaterials 13, no. 21: 2847. https://doi.org/10.3390/nano13212847

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