Cui, Y.; Gan, Y.; Wen, K.; Jiang, Y.; Chen, C.; Wang, Q.; Yu, H.
Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs. Nanomaterials 2025, 15, 1102.
https://doi.org/10.3390/nano15141102
AMA Style
Cui Y, Gan Y, Wen K, Jiang Y, Chen C, Wang Q, Yu H.
Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs. Nanomaterials. 2025; 15(14):1102.
https://doi.org/10.3390/nano15141102
Chicago/Turabian Style
Cui, Yifan, Yutian Gan, Kangyao Wen, Yang Jiang, Chunzhang Chen, Qing Wang, and Hongyu Yu.
2025. "Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs" Nanomaterials 15, no. 14: 1102.
https://doi.org/10.3390/nano15141102
APA Style
Cui, Y., Gan, Y., Wen, K., Jiang, Y., Chen, C., Wang, Q., & Yu, H.
(2025). Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs. Nanomaterials, 15(14), 1102.
https://doi.org/10.3390/nano15141102