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Journal: Photonics, 2024
Volume: 11
Number: 331

Article: A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics
Authors: by Yunke Sun, Wenjun Li, Xu Xing, Jianing Wang, Pengcheng Hu and Jiubin Tan
Link: https://www.mdpi.com/2304-6732/11/4/331

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