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Journal: Photonics, 2024
Volume: 11
Number: 331
Article:
A Picometre-Level Resolution Test Method without Nonlinearity for Heterodyne Interferometer Measurement Electronics
Authors:
by
Yunke Sun, Wenjun Li, Xu Xing, Jianing Wang, Pengcheng Hu and Jiubin Tan
Link:
https://www.mdpi.com/2304-6732/11/4/331
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