Ma, L.; Xu, X.; Cui, C.; Gao, M.; Li, T.; Lou, S.; Scott, P.J.; Jiang, X.; Zeng, W.
A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry. Photonics 2025, 12, 60.
https://doi.org/10.3390/photonics12010060
AMA Style
Ma L, Xu X, Cui C, Gao M, Li T, Lou S, Scott PJ, Jiang X, Zeng W.
A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry. Photonics. 2025; 12(1):60.
https://doi.org/10.3390/photonics12010060
Chicago/Turabian Style
Ma, Liyuan, Xipeng Xu, Changcai Cui, Mai Gao, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, and Wenhan Zeng.
2025. "A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry" Photonics 12, no. 1: 60.
https://doi.org/10.3390/photonics12010060
APA Style
Ma, L., Xu, X., Cui, C., Gao, M., Li, T., Lou, S., Scott, P. J., Jiang, X., & Zeng, W.
(2025). A Whale Optimization Algorithm-Based Data Fitting Method to Determine the Parameters of Films Measured by Spectroscopic Ellipsometry. Photonics, 12(1), 60.
https://doi.org/10.3390/photonics12010060
