Shan, C.; Han, P.; Wang, E.; Li, F.; Zhao, X.; Kou, H.; Jiang, D.; Wu, Q.; Peng, X.; Xu, P.;
et al. Characteristics of Fused Silica Exit Surface Damage by Low-Temporal Coherence Light Irradiation. Photonics 2025, 12, 432.
https://doi.org/10.3390/photonics12050432
AMA Style
Shan C, Han P, Wang E, Li F, Zhao X, Kou H, Jiang D, Wu Q, Peng X, Xu P,
et al. Characteristics of Fused Silica Exit Surface Damage by Low-Temporal Coherence Light Irradiation. Photonics. 2025; 12(5):432.
https://doi.org/10.3390/photonics12050432
Chicago/Turabian Style
Shan, Chong, Ping Han, Erxi Wang, Fujian Li, Xiaohui Zhao, Huamin Kou, Dapeng Jiang, Qinghui Wu, Xing Peng, Penghao Xu,
and et al. 2025. "Characteristics of Fused Silica Exit Surface Damage by Low-Temporal Coherence Light Irradiation" Photonics 12, no. 5: 432.
https://doi.org/10.3390/photonics12050432
APA Style
Shan, C., Han, P., Wang, E., Li, F., Zhao, X., Kou, H., Jiang, D., Wu, Q., Peng, X., Xu, P., Lian, Y., Zhao, Y., Su, L., Sui, Z., & Gao, Y.
(2025). Characteristics of Fused Silica Exit Surface Damage by Low-Temporal Coherence Light Irradiation. Photonics, 12(5), 432.
https://doi.org/10.3390/photonics12050432
