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Instruments, Volume 8, Issue 4 (December 2024) – 2 articles

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4 pages, 187 KiB  
Editorial
Advances in Space Astroparticle Physics: Frontier Technologies for Particle Measurements in Space
by Matteo Duranti and Valerio Vagelli
Instruments 2024, 8(4), 45; https://doi.org/10.3390/instruments8040045 - 12 Oct 2024
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Abstract
In the last decades, breakthrough advances in understanding the mechanisms of the Universe and fundamental physics have been achieved through the exploitation of data on cosmic rays and high-energy radiation gathered via orbiting experiments, in a synergic and complementary international effort that combines [...] Read more.
In the last decades, breakthrough advances in understanding the mechanisms of the Universe and fundamental physics have been achieved through the exploitation of data on cosmic rays and high-energy radiation gathered via orbiting experiments, in a synergic and complementary international effort that combines space-based instrument data with ground-based space observatories, accelerator, and collider experiments [...] Full article
10 pages, 4052 KiB  
Article
An In Situ Automated System for Real-Time Monitoring of Failures in Large-Scale Field Emitter Arrays
by Reza Farsad Asadi, Tao Zheng, Menglin Wang, Han Gao, Kenneth Sangston and Bruce Gnade
Instruments 2024, 8(4), 44; https://doi.org/10.3390/instruments8040044 - 6 Oct 2024
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Abstract
Nano-scale vacuum transistors (NVCTs) based on field emission have the potential to operate at high frequencies and withstand harsh environments, such as radiation, high temperatures, and high power. However, they have demonstrated instability and failures over time. To achieve high currents from NVCTs, [...] Read more.
Nano-scale vacuum transistors (NVCTs) based on field emission have the potential to operate at high frequencies and withstand harsh environments, such as radiation, high temperatures, and high power. However, they have demonstrated instability and failures over time. To achieve high currents from NVCTs, these devices are typically fabricated in large-scale arrays known as field emitter arrays (FEAs), which share a common gate, cathode, and anode. Consequently, the measured currents come from the entire array, providing limited information about the emission characteristics of individual tips. Arrays can exhibit nonuniform emission behavior across the emitting area. A phosphor screen can be used to monitor the emission pattern of the array. Additionally, visible damage can occur on the surface of the FEAs, potentially leading to the destruction of the gate and emitters, causing catastrophic failure of the FEAs. To monitor damage while operating the device, an ITO-coated glass anode, which is electrically conductive and visible-light-transparent, can be used. In this work, a method was developed to automatically monitor the emission pattern of the emitters and the changes in surface morphology while operating the devices and collecting electrical data, providing real-time information on the failure sequence of the FEAs. Full article
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