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10.3390/designs3040047
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Article

Evaluation of Microwave Characterization Methods for Additively Manufactured Materials

by
Chih-Kuo Lee
*,
Jack McGhee
,
Christos Tsipogiannis
,
Shiyu Zhang
,
Darren Cadman
,
Athanasios Goulas
,
Tom Whittaker
,
Reza Gheisari
,
Daniel Engstrom
,
John (Yiannis) Vardaxoglou
and
William Whittow
Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK
*
Author to whom correspondence should be addressed.
Designs 2019, 3(4), 47; https://doi.org/10.3390/designs3040047
Submission received: 31 July 2019 / Revised: 19 September 2019 / Accepted: 20 September 2019 / Published: 25 September 2019
(This article belongs to the Special Issue 3D-Printed RF Devices and Antennas)
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Abstract

Additive manufacturing (AM) has become more important and common in recent years. Advantages of AM include the ability to rapidly design and fabricate samples much faster than traditional manufacturing processes and to create complex internal geometries. Materials are crucial components of microwave systems and proper and accurate measurement of their dielectric properties is important to aid a high level of accuracy in design. There are numerous measurement techniques and finding the most appropriate method is important and requires consideration of all different factors and limitations. One limitation of sample preparation is that the sample size needs to fit in the measurement method. By utilizing the advantage of additive manufacturing, the material can be characterized using different measurement methods. In this paper, the additive manufacturing process and dielectric measurement methods have been critically reviewed. The test specimens for measuring dielectric properties were fabricated using fused filament fabrication (FFF)-based additive manufacturing and were measured using four different commercial dielectric properties measurement instruments including split post dielectric resonator (SPDR), rectangular waveguide, TE01δ cavity resonator, and open resonator. The measured results from the four techniques have been compared and have shown reasonable agreement with measurements within a 10 percent range.
Keywords: additive manufacturing; 3D printing; dielectric properties; measurements; characterization of materials; split post dielectric resonators; X-band waveguide; open resonator; cavity resonator additive manufacturing; 3D printing; dielectric properties; measurements; characterization of materials; split post dielectric resonators; X-band waveguide; open resonator; cavity resonator

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MDPI and ACS Style

Lee, C.-K.; McGhee, J.; Tsipogiannis, C.; Zhang, S.; Cadman, D.; Goulas, A.; Whittaker, T.; Gheisari, R.; Engstrom, D.; Vardaxoglou, J.; et al. Evaluation of Microwave Characterization Methods for Additively Manufactured Materials. Designs 2019, 3, 47. https://doi.org/10.3390/designs3040047

AMA Style

Lee C-K, McGhee J, Tsipogiannis C, Zhang S, Cadman D, Goulas A, Whittaker T, Gheisari R, Engstrom D, Vardaxoglou J, et al. Evaluation of Microwave Characterization Methods for Additively Manufactured Materials. Designs. 2019; 3(4):47. https://doi.org/10.3390/designs3040047

Chicago/Turabian Style

Lee, Chih-Kuo, Jack McGhee, Christos Tsipogiannis, Shiyu Zhang, Darren Cadman, Athanasios Goulas, Tom Whittaker, Reza Gheisari, Daniel Engstrom, John (Yiannis) Vardaxoglou, and et al. 2019. "Evaluation of Microwave Characterization Methods for Additively Manufactured Materials" Designs 3, no. 4: 47. https://doi.org/10.3390/designs3040047

APA Style

Lee, C.-K., McGhee, J., Tsipogiannis, C., Zhang, S., Cadman, D., Goulas, A., Whittaker, T., Gheisari, R., Engstrom, D., Vardaxoglou, J., & Whittow, W. (2019). Evaluation of Microwave Characterization Methods for Additively Manufactured Materials. Designs, 3(4), 47. https://doi.org/10.3390/designs3040047

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