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Moreno M, Torres-Sánchez A, Rosales P, Morales A, Torres A, Flores J, Hernández L, Zúñiga C, Ascencio C, Arenas A. Effect of the RF Power of PECVD on the Crystalline Fractions of Microcrystalline Silicon (μc-Si:H) Films and Their Structural, Optical, and Electronic Properties. Electronic Materials. 2023; 4(3):110-123. https://doi.org/10.3390/electronicmat4030009

Moreno, Mario, Arturo Torres-Sánchez, Pedro Rosales, Alfredo Morales, Alfonso Torres, Javier Flores, Luis Hernández, Carlos Zúñiga, Carlos Ascencio, and Alba Arenas. 2023. "Effect of the RF Power of PECVD on the Crystalline Fractions of Microcrystalline Silicon (μc-Si:H) Films and Their Structural, Optical, and Electronic Properties" Electronic Materials 4, no. 3: 110-123. https://doi.org/10.3390/electronicmat4030009

Moreno, M., Torres-Sánchez, A., Rosales, P., Morales, A., Torres, A., Flores, J., Hernández, L., Zúñiga, C., Ascencio, C., & Arenas, A. (2023). Effect of the RF Power of PECVD on the Crystalline Fractions of Microcrystalline Silicon (μc-Si:H) Films and Their Structural, Optical, and Electronic Properties. Electronic Materials, 4(3), 110-123. https://doi.org/10.3390/electronicmat4030009