1. Introduction
Photovoltaic (PV) systems play a central role in the global energy transition, offering a sustainable and renewable energy solution for electricity generation [
1,
2]. Thanks to their ability to convert solar energy directly into electricity, these systems are used in a wide variety of applications, ranging from large-scale power plants to stand-alone systems in remote areas. Their efficiency and reliability depend on the quality of the PV modules and their ability to operate optimally in a variety of environmental conditions [
3,
4]. Among the many applications of PV technologies, solar pumping systems have proved particularly advantageous, especially in rural areas for agricultural irrigation and water supply. These systems make it possible to reduce dependence on fossil fuels [
5] while providing access to water in areas where connection to the electricity grid is limited or non-existent. However, to maximize their potential, it is crucial to ensure rigorous quality control of the PV modules used and to continuously optimize their energy yield. In solar pumping systems, as in other PV systems, the performance of PV modules fluctuates according to climatic conditions, their lifespan, and the condition of the panels themselves (solar cell degradation, manufacturing defects or soiling). It is therefore essential to implement a tool that automatically assesses the performance of photovoltaic modules, not only to ensure that these systems operate efficiently and sustainably [
4], but also to guarantee the quality of the modules when they are purchased. Such a tool must be capable of measuring key parameters such as voltage and current in real time and assessing power, series and parallel resistance, form factor, conversion efficiency, etc., in order to detect any faults and adjust operations to maximize the energy efficiency of these panels, which still have a low conversion efficiency [
6].
Measurement of the current–voltage (I-V) characteristic curve is usually carried out by connecting a variable load to the terminals of the photovoltaic panel, which forces the operating point to cover the entire I-V characteristic. To do this, different types of variable resistive loads, capacitive load and active load based on linear circuits (based on transistors) are used in the literature to obtain this curve.
In approaches based on variable resistive loads, the photovoltaic (PV) array is loaded by a matrix of configurable resistors. Each configuration corresponds to a specific overall resistance value, forcing the PV array to reach a distinct operating point. By adjusting the load configuration manually [
7] or electronically [
8], it is possible to collect operating points along the
I-V curve [
9]. This method is very simple to implement, straightforward and cost-effective, and produces notable results for characterizing low-power PV modules [
10]. However, the number of possible configurations is limited, and the overall resistance values are fixed; moreover, for high power ratings, this method becomes cumbersome, bulky and expensive [
11]. Despite this, the variable resistance approach is still widely used, as it allows fast, static measurements.
The electronic charging method generally uses power transistors, such as BJTs, MOSFETs or IGBTs [
12]. When a MOSFET operates in its linear region (ohmic region), it acts as a variable resistor, where the resistance between drain and source (
RDS) varies as a function of the control voltage between gate and source (
VGS). Conversely, a BJT operates as a regulated current source, providing a controllable impedance by progressively modulating the input current ramp signal [
13]. The study in [
14] proposes the design of an
I-V curve plotter using an electronic load approach, combined with a low-cost wireless sensor network (WSN), allowing automated data logging for distributed photovoltaic modules [
11]. Using this method allows the
I-V curve to be refined and allows scans in any direction, from open circuit to short circuit and vice versa. However, MOSFETs have a finite value of
RDS(on) in the saturation region, which leads to measurement errors near
Isc. Furthermore, MOSFET transistors cannot generate
IDS in the cut-off region, which leads to incorrect measurement near
Voc [
11]. Transistors are only used to characterize PV modules with low power ratings, as they can only maintain high power for a few milliseconds as a load. For high power ratings, a heat sink and cooling fans are required for safe operation [
10].
The capacitor charging approach relies on the capacitor’s ability to emulate a variable resistance. When a DC voltage from the photovoltaic module is applied to the capacitor, the capacitor becomes charged, resulting in a gradual decrease in current magnitude and an increase in voltage [
13]. This method allows passive charging of the capacitor until the voltage exceeds that of the open circuit while recording the data points of the characteristic curve. It uses multiple high-voltage capacitors connected to active switches to meet different requirements for monitoring the current–voltage (
I-V) curve as the load changes [
10]. This approach is commonly used in commercial portable
I-V curve tracers due to its good scalability properties as well as its low volume and specific weight. In addition,
Isc and
Voc measurements are made with minimal error and ripple. However, this technique requires an additional discharge circuit to safely dissipate the capacitor’s stored charge. Additionally, when characterizing high-power cells or modules, the size of the capacitor becomes large and bulky.
It is clear from the above work that one of the remaining major challenges is the development of an automated solution for capturing I-V curves with increased accuracy while minimizing the cost and complexity of the system and maximizing its durability and adaptability to various applications.
This article proposes the development and enhancement of an automated tool for assessing the quality of the energy efficiency of photovoltaic systems using an approach based on the automated characterization of photovoltaic modules. The proposed tool rapidly measures and analyzes the electrical parameters of PV modules at various load levels to identify optimal performance points and ensure maximum utilization of the panel’s energy potential.
The document is structured as follows:
Section 2 details the electronic design of the proposed system.
Section 3 is devoted to the development of the system control algorithm and the approach used for parameter extraction.
Section 4 describes the experimental implementation of the device testing.
Section 5 analyzes and discusses the experimental results. The conclusion of this work, together with the outlook, is presented in
Section 6.
2. Electronic Design of the Proposed System
Figure 1 depicted the wiring diagram for the proposed device. It works as follows: after powering up, the panel to be characterized is connected to the device. Pressing the TEST button starts the characterization operation, which lasts about 10 s. The Arduino Mega first sends a control signal to the relay, which closes its contact, then generates a variable duty cycle PWM signal applied to the base of the 2N2222A bipolar transistor. The latter acts as a power interface for the IRLZ34NPbF MOSFET, used as a variable load. The shunt resistor is used to measure the current delivered by the panel, while the 150 kΩ and 12 kΩ resistors connected as a bridge divider are used to estimate the panel voltage. The LM35DZ temperature sensor measures the panel’s operating temperature. Additionally, 4.7 V Zener diodes protect the Arduino’s inputs from overvoltage, and the MBR10100 diode protects the device from reverse polarity. Once the characterization is complete, the Arduino sends a control signal to the relay, which this time opens its contact. The extracted parameters are then displayed on the 20 × 4 LCD screen. To save the data to the SD card, it is necessary to press the SAVE button. The input characteristics of the proposed system are listed in
Table 1.
The choice of the Arduino Mega as the control platform for our proposed system was primarily motivated by its affordability, ease of programming, broad community support and compatibility with a variety of sensors and actuators. These features make it an attractive option for prototyping and experimental validation. However, it is important to recognize that the low cost of the Arduino Mega and other components comes with some drawbacks related to power consumption and durability, which are discussed below:
The Arduino Mega is based on the ATmega2560 microcontroller (manufactured by Microchip, a company based in the United States of America), which is not specifically optimized for low-power applications. Its typical consumption varies from around 50 to 70 mA in operation, which can be considered high compared with that of other microcontrollers designed for energy-saving systems.
As a general-purpose development board, the Arduino Mega is not designed to operate in industrial or harsh environments. Factors such as temperature variations, humidity, dust and mechanical stress can adversely affect its performance and longevity. In addition, its use of standard rather than industrial quality components may reduce its reliability over a prolonged period of use.
Despite these limitations, the Arduino Mega remains a judicious choice for the current stage of this research because of its simplicity and its compatibility with the proposed control strategy.
2.1. The Photovoltaic Generator
In this work, the photovoltaic generator using the single diode model was modeled and simulated. This model is not only simple to implement but also accurate [
15]. Furthermore, studies [
16,
17] conclude in that this model is the most appropriate for monocrystalline cells. The electrical circuit of this model is shown in
Figure 2.
By applying Kirchhoff’s law to the circuit in
Figure 2, the expression in Equation (1) is obtained, which represents the current delivered by the PV cell.
With
where
V is the voltage of the PV panel,
Vt is the thermal voltage,
Iph is the generated photocurrent,
q is the electron charge,
Io is the diode reverse saturation current,
n is the diode ideality factor,
k is the Boltzmann constant,
T is the surface cell temperature and
Nsc is total number of series cells,
Rsh and
Rs are the parallel and series resistances, respectively.
The photovoltaic (PV) panel used in this article is the solar photovoltaic Helios module. Its data sheet is presented in
Table 2 and gives specific parameters under standard test conditions (STC: T = 298.15 K and G = 1000 W/m
2). However, some essential data for PV panel implementation, such as diode saturation current, photocurrent, ideality factor, and series and parallel resistances, are not included. To determine these parameters, a simple tool provided by MathWorks, called “PV Array” and available in Matlab R2020a, was used [
18] to automatically generate the missing values from the data sheet. Subsequently, a photovoltaic panel model was designed and simulated using module surface temperature (°C), irradiance (W/m
2), series resistance (Ω) and parallel resistance (Ω) as input parameters. For the purposes of this simulation, the values
Rs = 0.01 Ω and
Rsh = 1000 Ω were set. By varying the meteorological parameters, such as irradiance and PV module temperature, the characteristic curves of the photovoltaic panel were obtained and are presented in
Figure 3.
The characteristic curves of the photovoltaic panel presented in
Figure 3 show that, like any other semiconductor component, they are affected by variations in temperature and are also sensitive to fluctuations in irradiance [
18,
19,
20]. It can be seen that the voltage
Voc decreased with increasing temperature. This was due to the temperature dependence of the band gap of the semiconductor material, which reduces the potential energy of the charge carriers. In addition, the current
Isc depends mainly on solar irradiation: higher irradiation generates more photons, thus increasing the number of charge carriers.
2.2. Electronic Load
When selecting MOSFETs for the electronic load, it is essential to take into account specific criteria to ensure the safety and accuracy of measurements. The drain-source voltage (
VDS) of the transistors must be at least 15% higher than the open-circuit voltage of the photovoltaic array, while the drain-source current (
IDS) must exceed the short-circuit current of the array by 10%. In addition, this choice is influenced by other important criteria, such as component availability, cost and minimizing the PCB footprint.
Table 3 shows the characteristics of the MOSFET
S used,
VDS,
IDS,
RDS(ON) and the operating temperature range.
The MOSFET functions as an electronic switch. When the MOSFET is driven by a PWM signal, the apparent resistance of the MOSFET is an average of the resistance between two states (ON and OFF), as a function of the duty cycle or duty cycle of the PWM signal. If
RDS(ON) is the resistance when it is switched on and
RDS(OFF) is the resistance when it is switched off (which is practically infinite), the apparent resistance
Rload perceived by the solar panel is a function of the duty cycle of the PWM signal applied between its gate and its source. This apparent resistance, in view of the characteristic curves of the MOSFET, can be approximated as the relationship in Equation (3).
- –
If D = 0, this means that the MOSFET is switched off for the whole period and does not conduct any current, so Rload tends towards infinity.
- –
If D = 1, this means that the MOSFET is always on and the apparent resistance is simply Rload = RDS(ON).
In this way, the apparent resistance perceived by the load is reduced as the duty cycle D is increased, and vice versa.
2.3. Measurement Sensors
The current is measured using a 0.33 Ω shunt resistor instead of an ACS712 current sensor due to availability constraints. For voltage measurement, a simple resistor-based divider circuit is used to measure the photovoltaic array’s voltage. This voltage divider reduces the generator output voltage to below 5 V using a combination of low-tolerance resistors. Temperature measurement is achieved using an analog sensor with an accuracy of less than ±1 °C. This sensor can measure temperatures ranging from −55 to +150 °C with a sensitivity of 10 mV/°C.
4. Implementation Aspects
To assess the effectiveness of the proposed system, an experimental test bench was designed to characterize the performance of the photovoltaic panels. The experimental campaign was carried out at the LESIA Laboratory of the University of Ngaoundéré, Cameroon, on 21 November 2024. The hardware configuration is shown in
Figure 7. The solar photovoltaic Helios module to be characterized was connected to the load via a set of essential sensors, allowing real-time monitoring of key parameters such as current, voltage and panel temperature. This data was transmitted to a processing unit, which played a central role in analyzing and managing the information. Once the measurements were collected, they were displayed instantly on an LCD screen for quick reference. Thanks to an intuitive user interface, the operator can interact with the system and, with a simple command pulse, trigger the recording of data on a storage medium, such as an SD card, for later in-depth analysis. The entire device was powered by a dedicated power supply, ensuring stable, continuous operation of the various electronic components. This test bench provides a robust and flexible platform for evaluating the performance of photovoltaic panels, offering both real-time monitoring and data logging capability for optimized operation.
Figure 8 shows an internal view of our experimental prototype. It consists of an Arduino Mega, acting as the control interface, and a power interface driving the IRLZ34NPbF MOSFET (manufactured by Vishay Intertechnology in Pennsylvania in the United States of America) used as a variable load. The system also incorporates Zener diodes, a shunt resistor, various resistors, a man–machine interface button and the LM35DZ temperature sensor (manufactured by Microchip, a company based in the United States of America). The characteristics of the various components used are detailed in
Table 4. As shown in
Table 5, the total cost of the prototype is around EUR 50, and should fall in the event of mass production.
Table 5 clearly demonstrates the cost-effectiveness of the proposed card compared to that of commercial devices, which generally use bulky and expensive charging capacitors.
The sensors used in the proposed device were calibrated using measurement instruments on the TB-1200 electronic workbench, achieving an accuracy of less than 1%. This level of accuracy is comparable to, or even superior to, that of certain commercial devices used for similar applications, such as the Amprobe Solar-600 and Seaward PV200.
Several experiments were carried out to analyze the impact of sunlight conditions on the performance of the photovoltaic module. First, the photovoltaic module was fully exposed to light, as shown in
Figure 7. Subsequently, some cells of the module were partially shaded in order to simulate the partial shading phenomena of 20% and 50%, shown in
Figure 9a and
Figure 9b, respectively.
Finally, to complete our study, the temperature at the surface of the module was measured. The experimental configuration is shown in
Figure 10.
5. Experimental Results
In this section, the results obtained during the experimental campaign carried out at the LESIA Laboratory are presented. These data constitute an essential set of in-depth experiments on PV solar technology. During this campaign, the current–voltage (I-V) and the power–voltage (P-V) curves were measured with scientific thoroughness, maintaining a constant sampling frequency, thus guaranteeing the reliability and comparability of the results.
Figure 11 illustrates the evolution of solar irradiance and temperature over the experimental day. The blue curve represents irradiance (W/m
2), which rose gradually in the morning, reaching a maximum around midday, and then fell gradually in the afternoon, following the solar cycle. The orange curve, representing temperature (°C), showed a more stable evolution: it rose slightly at the start of the day, remained relatively constant at around 35–40 °C despite irradiance variations, then began to fall later in the afternoon. This difference can be explained by thermal inertia, which means that temperature did not fall immediately after irradiance decreased. The figure shows the relationship between these two parameters, highlighting the time lag between peak irradiance and peak temperature.
5.1. Performance Under Normal Operation
Figure 12 show typical plots of the current–voltage (
I-V) and power–voltage (
P-V) output characteristic curves of the prototype device for the clean solar photovoltaic Helios module under different weather conditions. The difference between the performance and the effect of varying weather conditions combined with the panel’s manufacturing quality can be seen in the curves. This is to be expected, as the electrical characteristics of a panel are highly dependent on the characteristics of the materials, the climate and the quality of the manufacturing process.
Figure 12a,b illustrate tests carried out under clear, unclouded skies, characterized by very high irradiance.
Figure 12c, on the other hand, shows a test carried out under cloudy skies but with high irradiance. Finally,
Figure 12d shows a test carried out under cloudy skies with medium irradiance.
The
Table 6 present the parameter characteristics extracted at normal operation. From
Figure 12 and
Table 6 it is clear that when our dummy load was fully powered, the MOSFET in it did not fully reach or break the maximum open-circuit voltage, as indicated in [
11]. This was due to the contribution of the combination of the MOSFET’s drain-to-source resistor,
RDS, and the 0.33 Ω current-sensing resistor at its source, i.e., (
RDS +
RS = 35 mΩ + 0.33 Ω = 365 mΩ). One of the plots shows that
Vpv = 0.7 V when
Isc = 3.37 A and
Voc = 20.36 V when
Isc = 0.03 A. To guarantee the reliability of the measurements made by our device, one of the things we did was calibrate our various sensors (voltage and current) using the instruments on the TB-1200 electronic workbench, which guarantees deviations of no more than 1% from the equipment’s instruments.
Additionally, the temperature of the module’s underside during these tests ranged from approximately 36.5 to 50 °C, representing an increase of about 68.5% to over 100% compared to the module’s temperature under STC conditions (STC = 25 °C). This may also have contributed to the slight voltage drop compared to the manufacturer’s Voc specification of 21.5 V.
The current–voltage (
I-V) and power–voltage (
P-V) characteristic curves of the tested module reveal its electrical performance under various weather conditions. The key parameters extracted (maximum power, voltage and current under short-circuit and open-circuit conditions, fill factor, series and parallel resistances) presented in
Table 4 allow for evaluating the module’s quality and its associated losses.
The series resistance is an indicator of ohmic losses through the contacts, internal connections and semiconductor materials of the module. The
Rs values varied very slightly, ranging from 0.82 to 1.1 Ω. This narrow range indicates better electrical performance as it minimizes power losses caused by Joule heating. Additionally, we observed that as irradiance and temperature decreased, the series resistance increased, and vice versa, which aligns with the findings of [
22,
23].
The parallel resistance reflects current leakage through junctions or defects in the module. A high Rsh value is desirable as it indicates minimal leakage current losses. The Rsh values ranged from 194.91 to 263.40 Ω, indicating a module with minimal leakage losses and good electrical insulation.
Modules with low series resistance (
Rs) and high shunt resistance (
Rsh) exhibit superior overall performance, characterized by higher maximum power (
Pmppt) and a better fill factor (FF) [
4], resulting in
P-V and
I-V curves that closely resemble ideal conditions. Notably, the fill factor of these modules remains nearly constant despite variations in irradiance and temperature, as observed in [
23]. In contrast, modules with high
Rs and low
Rsh experience significant reductions in
Pmppt, short-circuit current (
Isc) and
FF due to increased ohmic resistances and current leakage, leading to substantial performance losses.
Comparing the results of simulations (see
Figure 3) with those of the experimental measurements (see
Figure 12), the following differences can be observed:
The simulated open-circuit voltage (Voc) was about 9% higher than the measured value.
The measured short-circuit current (Isc) was 6.7% lower than that obtained by simulation.
The measured maximum power was 13% lower than the simulated one.
The measured voltage at the point of maximum power (Vmppt) was 5.5% below the simulated value.
The 10–13% overall difference in maximum power can be attributed to several factors, including:
Losses due to parasitic resistances (wiring, connections), which were not always accurately taken into account in the simulation.
Temperature variations, which influence solar panel performance and may differ between actual conditions and model assumptions.
Uncertainties and inaccuracies in experimental measurements, which can introduce a bias into the comparison.
Furthermore, these deviations are strongly influenced by the values of the series (
Rs) and parallel (
Rsh) resistances used in the simulations. As shown in
Section 3.2 and
Section 3.3, these parameters directly affect the shape of the
I-V and
P-V curves, and hence the estimated performance of the solar panel.
These differences highlight the fact that, although modeling can provide a satisfactory estimate of general trends, the adjustment of model parameters to experimental data remains essential. A more rigorous approach would involve extracting Rs and Rsh from actual measurements, or explicitly incorporating losses into the model in order to improve prediction accuracy and significantly reduce these discrepancies.
5.2. Experimental Result for 20% Partial Shading
To assess the impact of partial shading, tests were carried out by progressively covering different sections of the panel. Once the characterization test was launched, 20% of the panel surface was shaded. The results of this experiment are shown in
Figure 13, while
Table 7 presents the parameters extracted for this level of shading.
5.3. Experimental Result for 50% Partial Shading
The panel was then progressively shaded until 50% partial shading was achieved. The results of this experiment are shown in
Figure 14, while
Table 8 shows the parameters extracted for this level of shading.
From
Figure 13 and
Figure 14 and
Table 7 and
Table 8, it can be seen that the series resistance (
Rs) increases and the shunt resistance (
Rsh) decreases as a function of the intensity of the partial shading applied to the cells of the panel tested. In addition, this partial shading has a significant effect on the fill factor (
FF), leading to a reduction in the efficiency of the panel and, consequently, the efficiency of the system in which it is used.
Analysis of the series and parallel resistances highlights the manufacturing quality and state of health of the modules tested. Regarding the fill factor, it can be noted that it was significantly impacted by partial shading but remains within the range reported in the conclusions of [
7]. This analysis allows us to conclude that this panel is of good quality if we exclude the effects of simulated shading.
During these partial shading tests, increases in panel surface temperature of 1.5 °C and 2.5 °C, respectively, were observed. This was probably due to the activation of bypass diodes when certain cells are shaded. These diodes protect the shaded cells and allow the current to bypass the shaded areas. However, this process introduces additional resistance into the overall circuit, resulting in a temporary, localized temperature rise (the “hot-spot” effect).