Reprint

Advanced Polarimetry and Polarimetric Imaging

Edited by
July 2024
228 pages
  • ISBN978-3-7258-1732-0 (Hardback)
  • ISBN978-3-7258-1731-3 (PDF)

This is a Reprint of the Special Issue Advanced Polarimetry and Polarimetric Imaging that was published in

Engineering
Physical Sciences
Summary

As a fundamental property of the light wave, polarization information can be used to reveal the light and target’s physical properties, such as the material, thickness, surface features, refractive index, etc. Thanks to the unique advantages of polarization information, polarimetry and polarimetric imager techniques have promising applications in several fields, including object detection, biomedical imaging, remote sensing, astronomical observation, the characterization of surfaces and thin films, optical communication, etc. The theories, instruments, and interpretation methods for polarimetry and polarimetric imaging are constantly developing; therefore, improving the performance of polarimetry and polarimetric imagers and exploring related applications are still necessary to address existing challenges and expand the potential of polarimetric imaging. “Advanced Polarimetry and Polarimetric Imaging” highlights new theories in and applications of advanced polarimeters and polarimetric imaging. Seventeen manuscripts were submitted to this reprint. This reprint on polarization technology illustrates the field’s notable progress and potential. It features research articles that introduce innovative solutions and tackle key challenges in polarimetric image restoration, 3D reconstruction, high-speed Mueller ellipsometry, and P-lidar. These promising applications and novel approaches in polarimetry and imaging technology herald a promising future.

Format
  • Hardback
License and Copyright
© 2024 by the authors; CC BY-NC-ND license
Keywords
nanoimprint photolithography process; cross-scale micro–nano process; polarization sensor; navigation; Sobel operator; FLICM; EUV solar boundary; solar center; AIA/SDO; three-dimensional face reconstruction; polarization; ambiguous normal correction; CNN; rough depth map; underwater imaging; polarimetric imaging; high-turbidity water; histogram equalization; polarization; polarization imaging; U-net; electromagnetic metamaterials; perfect absorption; terahertz; impedance matching; coherent absorption; narrow band absorbers; dual-frequency absorbers; multi-frequency absorbers; broadband absorbers; tunable absorbers; structural color; metasurface; chiral; anti-counterfeit; structural color; metasurface; Si nanostructures; polarization; Mueller matrices; polarimetry; diattenuation; polarizance; depolarization; Mueller matrix ellipsometer; birefringent; waveplate; calibration; field-of-view effect; thickness measurement; vertical optical layout; polarization effect calibration; polarization modulation and demodulation reference plane; incidence plane switching; high-speed Mueller matrix ellipsometer; polarization 3D imaging; tunnel lining crack; crack detection; polarization camera; polarization; lidar; remote sensing; P-lidar; surface wave; leaky wave; complex wave; Goubau line; Maxwell’s equations; spectrum; numerical method; n/a

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