**4. Results and Discussion**

The results present the effect of various parameters on the thermal behavior of the coin cell with internal short circuit caused by penetrating element. The numerical model is used to simulate the thermal behavior of the penetrating element before the coin cell reaches 150 ◦C [17]. Thermal runaway behavior, including material decomposition, is not included in the present study. The focus of the present study is to analyze the thermal abuse behavior due to internal short circuit before the coin cell temperature reaches thermal runaway [17]. The experimental study was conducted at a 1C discharge rate, with a fully-charged coin cell, at a controlled ambient temperature of 25 ◦C. A battery specific model was developed with *U* and *Y* as functions of depth of discharge, using experimental voltage, current, and temperature data with the parameter estimation tool. For all numerical simulations in the present study, the developed model parameters were treated as reference model parameters.
