3.4.3. XRD

The diffractograms of the samples were recorded with an X-ray diffractometer (X'Pert Pro XRD, PANalytical, The Netherlands) operating at 40 kV and 25 mA with CuK α radiation (λ = 1.5418 Å). The data were collected at a scanning speed of 10◦·min−<sup>1</sup> and a 2θ range of 5–90◦.
