Crystal Growth of III–V Semiconductors

A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Inorganic Crystalline Materials".

Deadline for manuscript submissions: closed (30 August 2025) | Viewed by 4010

Special Issue Editors


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Guest Editor
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
Interests: compound semiconductors; epitaxial growth; MOCVD; MBE; metamorphic; hetero-epitaxy; optoelectronics;

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Guest Editor
Polymer Energy Materials Laboratory, School of Chemical Engineering, Chonnam National University, Gwangju 61186, Korea
Interests: synthesis; 1D and 3D nanostructures; perovskite solar cells; solar cells
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Special Issue Information

Dear Colleagues,

III–V semiconductors are binary, ternary, quaternary, quinary (and so on) alloys, containing elements from groups III (Al, Ga, In, B, and Tl) and V (N, P, As, Sb, and Bi) in the periodic table. They are widely applied in high-performance optoelectronic and electronic devices due to their superior electronic and optical properties, including high electron mobility, direct band gap, low exciton binding energy, and the ability to cover a vast bandgap energy range. The properties enable high speed, high temperature, high current, and high voltage in optoelectronic devices ranging from the ultraviolet to the terahertz band. 

The epitaxial growth of III–V semiconductors is fundamental to these devices; high single-crystal quality, atomic-layer-scale controllability, and mass productive ability are provided by the utilization of metalorganic chemical vapor deposition, molecular beam epitaxy, liquid phase epitaxy, hydride vapor phase epitaxy, and others. Phosphides and arsenides have been fully developed and widely used in the communication, industry, energy, aerospace, defense, automotive, and healthcare fields. Nitrides are newly developed, and exciting breakthroughs have also been made regarding antimonides. 

Coherent growth is the growth mode of compound semiconductor thin films, and the lattice mismatch between substrates and epitaxial layers fundamentally restrains the crystal quality. Recently, metamorphic growth, via graded buffer layers and the two-step growth technique, has been developed to overcome this limitation. Nitride growth on sapphire is one benefit of this technique. It can also provide the ability to grow III–V on silicon, which could be the best solution for the creation of light sources in silicon photonics. 

The present Special Issue, entitled “Crystal Growth of III–V Semiconductors,” offers researchers in the field of III–V compound growth the opportunity to present new approaches that would enable better quality to be achieved, overcome the traditional limitation of coherent growth, and realize new applications via novel material combinations. The current status and roadmap for III–V semiconductor materials’ growth could also be determined.

Dr. Xin Wei
Dr. Sawanta S. Mali
Guest Editors

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Keywords

  • epitaxy
  • MOCVD 
  • MBE
  • III–V semiconductor

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Published Papers (3 papers)

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Research

14 pages, 4562 KB  
Article
Step-Graded III–V Metamorphic Buffers on Ge for High-Efficiency Photovoltaics: Investigation of Strain Relaxation and Morphology Evolution
by Elisabetta Achilli, Nicola Armani, Jacopo Pedrini, Erminio Greco, Salvatore Digrandi, Andrea Fratta, Fabio Pezzoli, Roberta Campesato and Gianluca Timò
Crystals 2025, 15(10), 900; https://doi.org/10.3390/cryst15100900 - 17 Oct 2025
Cited by 2 | Viewed by 605
Abstract
This work is motivated by the need to enhance efficiency and radiation resistance and reduce weight in high-performance photovoltaic devices, with applications spanning both terrestrial and space environments. Metamorphic buffers are key enablers for reducing defect formation in lattice-mismatched structures, which are among [...] Read more.
This work is motivated by the need to enhance efficiency and radiation resistance and reduce weight in high-performance photovoltaic devices, with applications spanning both terrestrial and space environments. Metamorphic buffers are key enablers for reducing defect formation in lattice-mismatched structures, which are among the most widespread technologies for high-efficiency photovoltaic energy conversion. Although many systems have been created, absolute certainty about the effective relaxation mechanism remains unattained. In this work, MOVPE-grown step-graded buffers with variable In content were obtained on Ge substrates and investigated to identify the critical thresholds that govern strain relaxation and defect formation. The results show that the buffers are fully strained when the In top-layer content is <6.0%, while a degree of relaxation in the entire structure appears when the In top-layer content is >6.0%. In addition, the relaxation phenomenon is paralleled by the formation of a tilt angle between the layers and the substrate. We also found evidence that the appearance of relaxation is not limited to the upper layer but is presented by the structure as a whole. The effects of Te doping inside the InGaAs layers were also investigated: Te does not influence the structure of the crystal, but it introduces a Burstein–Moss blue shift in the photoluminescence energy of about 20 meV. Eventually, to reduce defect formation with the goal of achieving high-efficiency photovoltaic devices, a thick layer with a lower In content was grown onto the overshoot material (In0.12Ga0.88As). The results obtained confirm the high quality of the buffers and unveil the critical points, which are responsible for the most important changes in the buffer architecture and should be considered in future material engineering. The results provide valuable insights for the design of high-performance, sustainable photovoltaic devices and contribute to the advancement of III–V semiconductor integration on Ge substrates. Full article
(This article belongs to the Special Issue Crystal Growth of III–V Semiconductors)
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15 pages, 4652 KB  
Article
All MOVPE Grown Quadruple Junction InGaP/InGaAs/Ge/Ge Solar Cell
by Gianluca Timò, Marco Calicchio, Elisabetta Achilli, Nicola Armani, Filippo Annoni, Franco Trespidi, Mario V. Imperatore, Edoardo Celi and Alessandro Minuto
Crystals 2025, 15(9), 816; https://doi.org/10.3390/cryst15090816 - 18 Sep 2025
Viewed by 779
Abstract
Most commercially available InGaP/InGaAs/Ge triple-junction solar cells suffer from current mismatch due to the excess current generated by the Ge sub-cell. Combining epitaxial germanium with III–V materials would enable the realization of lattice-matched four- or five-junction solar cells, where the near-infrared spectrum could [...] Read more.
Most commercially available InGaP/InGaAs/Ge triple-junction solar cells suffer from current mismatch due to the excess current generated by the Ge sub-cell. Combining epitaxial germanium with III–V materials would enable the realization of lattice-matched four- or five-junction solar cells, where the near-infrared spectrum could be split between two Ge sub-cells instead of one, thereby eliminating current mismatch in these devices and achieving higher conversion efficiency. In this work, we present the first demonstration of a quadruple-junction (4J) InGaP/InGaAs/Ge/Ge device, with all layers sequentially deposited in the same MOVPE growth chamber. The 4J device also features a novel architecture that exploits the “transistor effect” between the two Ge junctions to eliminate the current mismatch in the upper 3J InGaP/GaAs/Ge part. We describe the growth and the cell structure realization strategy developed to overcome—and, where beneficial, to exploit—the cross-contamination between III–V and group IV elements, thus avoiding the need for two separate deposition systems. The structural and electrical characterizations performed to ascertain the 4J device quality are presented. This result represents a key step toward the realization of highly efficient, all-MOVPE-grown, lattice-matched MJ solar structures that combine III–V and group IV alloys. Full article
(This article belongs to the Special Issue Crystal Growth of III–V Semiconductors)
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10 pages, 2586 KB  
Article
AlGaN-Based Ultraviolet PIN Photodetector Grown on Silicon Substrates Using SiN Nitridation Process and Step-Graded Buffers
by Jian Li, Yan Maidebura, Yang Zhang, Gang Wu, Yanmei Su, Konstantin Zhuravlev and Xin Wei
Crystals 2024, 14(11), 952; https://doi.org/10.3390/cryst14110952 - 31 Oct 2024
Cited by 3 | Viewed by 1821
Abstract
The integration of aluminum gallium nitride (AlGaN) with silicon substrates attracts significant attention due to the superior UV sensitivity of AlGaN and the cost-effectiveness as well as mechanical robustness of silicon. A PIN ultraviolet photodetector with a peak detection wavelength of 274 nm [...] Read more.
The integration of aluminum gallium nitride (AlGaN) with silicon substrates attracts significant attention due to the superior UV sensitivity of AlGaN and the cost-effectiveness as well as mechanical robustness of silicon. A PIN ultraviolet photodetector with a peak detection wavelength of 274 nm is presented in this paper. By employing a SiN nucleation layer and a step-graded buffer, a high-quality AlGaN-based photodetector structure with a dislocation density of 2.4 × 109/cm2 is achieved. A double-temperature annealing technique is utilized to optimize the Ohmic contact of the n-type AlGaN. The fabricated UV photodetector attains a dark current of 0.12 nA at −1 V and a peak responsivity of 0.12 A/W. Full article
(This article belongs to the Special Issue Crystal Growth of III–V Semiconductors)
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