Microwave Measurements, Methods and Instruments

Dear Colleagues,

The RF, microwave, and millimeter-wave domains of the electromagnetic spectrum continue to play a transformative role across science and technology. In the 0.1–100 GHz range, measurement techniques have reached extraordinary levels of sensitivity, precision, and versatility, enabling breakthroughs that extend far beyond more traditional applications. Today, the same underlying measurement principles and technologies are driving progress in remarkably diverse areas: metrology, fundamental physics experiments, biomedical diagnostics and health monitoring, non-destructive evaluation of cultural heritage and infrastructure, advanced materials and metamaterials characterization, quantum devices and cryogenic systems, space and aerospace instrumentation, industrial process control, security screening, environmental sensing, and emerging imaging methodologies.

While these fields often evolve within separate scientific communities, they are increasingly connected by common experimental challenges, shared instrumentation platforms, and converging technological solutions. Techniques developed for one application can rapidly unlock innovation in entirely different domains. This cross-sector contamination is no longer optional; it is a key driver of scientific and technological advancement. For this reason, this Special Issue aims to create a dynamic forum where such cross-fertilization can flourish. We welcome original research contributions presenting innovative methods, measurement techniques, instrumentation concepts, calibration and uncertainty evaluation strategies, modeling, simulation approaches, and experimental methodologies operating in the RF, microwave, and millimeter-wave frequency ranges. By bringing together researchers, engineers, and industry practitioners working in different application sectors but united by shared technologies, this Special Issue seeks to accelerate the exchange of ideas and promote measurement solutions that are more accurate, robust, scalable, and impactful.

Dr. Erika Pittella
Dr. Andrea Alimenti
Dr. Giovanni Gugliandolo
Dr. Mariangela Catena Latino
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Instruments is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• microwaves
• radio frequency
• instruments
• resonators
• wideband methods and instruments
• RF and microwave material characterization
• quantum computing devices
• obstacle penetrating RF and microwave techniques
• high frequency imaging techniques
• microwave devices for health
• microwave remote sensors