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Keywords = bidirectional transmittance distribution function (BTDF)

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9 pages, 4343 KiB  
Article
Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing
by Adrian Zakrzewski, Piotr Jurewicz, Michał Ćwikła, Piotr Koruba and Jacek Reiner
Sensors 2021, 21(1), 8; https://doi.org/10.3390/s21010008 - 22 Dec 2020
Cited by 1 | Viewed by 2609
Abstract
Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Therefore, we propose an approach for [...] Read more.
Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Therefore, we propose an approach for reconstruction of the reflection distribution based on a series of measurements at different illumination angles and extrapolation of the missing results to overcome this limitation. The developed algorithm was validated using bidirectional transmittance distribution function (BTDF) measurements. The BRDF measurements were carried out for materials that are commonly used in laser material processing, i.e. substrates and functional coatings. The obtained data were subsequently used to determine the total reflection intensity from all considered materials, which were characterized by reconstructed distributions. Full article
(This article belongs to the Section Optical Sensors)
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12 pages, 7505 KiB  
Article
Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods
by Tsung-Xian Lee and Ching-Chia Chou
Energies 2017, 10(4), 424; https://doi.org/10.3390/en10040424 - 23 Mar 2017
Cited by 12 | Viewed by 6443
Abstract
A multiscale model that enables quantitative understanding and prediction of the size effect on the scattering properties of micro- and nanostructures is crucial for the design of light-emitting diode (LED) surface textures optimized for high light extraction efficiency (LEE). In this paper, a [...] Read more.
A multiscale model that enables quantitative understanding and prediction of the size effect on the scattering properties of micro- and nanostructures is crucial for the design of light-emitting diode (LED) surface textures optimized for high light extraction efficiency (LEE). In this paper, a hybrid process for combining full-wave finite-difference time-domain simulation and a ray-tracing technique based on a bidirectional scattering distribution function model is proposed. We apply this method to study the influence of different pattern sizes of a patterned sapphire substrate on GaN-based LED light extraction from the micro-scale to the nano-scale. The results show that near-wavelength–scale patterns with strong diffraction are not expected to enhance the LEE. By contrast, micro-scale patterns with optical diffusion behavior have the highest LEE at a specific aspect ratio, and subwavelength-scale patterns that have antireflection properties show a marked enhancement of the LEE for a wide range of aspect ratios. Full article
(This article belongs to the Special Issue Solid State Lighting)
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