Search Results (168)

Mineral identification technology is a key technology in the construction of intelligent mines. In ore classification and detection, mining scenarios present challenges, such as diverse ore types, significant scale variations, and complex surface textures. Traditional detection models often suffer from insufficient multi-scale feature representation and weak dynamic adaptability, leading to the missed detection of small targets and misclassification of similar minerals. To address these issues, this paper proposes an efficient multi-scale ore classification and detection model, YOLO-EDH. To begin, standard convolution is replaced with deformable convolution, which efficiently captures irregular defect patterns, significantly boosting the model’s robustness and generalization ability. The C3k2 module is then combined with a modified dynamic convolution module, which avoids unnecessary computational overhead while enhancing the flexibility and feature representation. Additionally, a content-guided attention fusion (HGAF) module is introduced before the detection phase, ensuring that the model assigns the correct importance to various feature maps, thereby highlighting the most relevant object details. Experimental results indicate that YOLO-EDH surpasses YOLOv11, improving the precision, recall, and mAP50 by 0.9%, 1.7%, and 1.6%, respectively. In conclusion, YOLO-EDH offers an efficient solution for ore detection in practical applications, with considerable potential for industries like intelligent mine resource sorting and safety production monitoring, showing notable commercial value. Full article

Graphene/h-BN/Si heterostructures show considerable potential for future use in infrared detection and photovoltaic technologies due to their adjustable electrical behavior and well-matched interfacial structure. The near-lattice match between graphene and hexagonal boron nitride (h-BN) enables the deposition of low-defect-density graphene on h-BN surfaces. This study presents a thorough exploration of the low-frequency electrical noise behavior of graphene/h-BN/Si heterojunctions under both forward and reverse bias conditions at room temperature. Graphene nanolayers were directly grown on h-BN films using microwave plasma-enhanced CVD. The h-BN layers were formed by reactive high-power impulse magnetron sputtering (HIPIMS). Four h-BN thicknesses were examined: 1 nm, 3 nm, 5 nm, and 15 nm. A reference graphene/Si junction (without h-BN) prepared under identical synthesis conditions was also studied for comparison. Low-frequency noise analysis enabled the identification of dominant charge transport mechanisms in the different device structures. Our results demonstrate that grain boundaries act as dominant defects contributing to increased noise intensity under high forward bias. Statistical analysis of voltage noise spectral density across multiple samples, supported by Raman spectroscopy, reveals that hydrogen-related defects significantly contribute to 1/f noise in the linear region of the junction’s current–voltage characteristics. This study provides the first in-depth insight into the impact of h-BN interlayers on low-frequency noise in graphene/Si heterojunctions. Full article

Partial discharge (PD) is not only a critical indicator but also a major accelerating factor of insulation degradation in power transformers. Accurate identification of PD types is essential for diagnosing insulation defects and locating faults in transformers. Traditional methods based on phase-resolved partial discharge (PRPD) patterns typically rely on expert interpretation and manual feature extraction, which are increasingly being supplanted by Convolutional Neural Networks (CNNs) due to their ability to automatically extract features and deliver high classification accuracy. However, the inherent subtlety and diversity of characteristic differences among PRPD patterns, coupled with substantial noise resulting from complex electromagnetic interference, present significant hurdles to achieving accurate identification. This paper proposes a transformer partial discharge identification method based on Deep Residual Shrinkage Network (DRSN) to address these challenges. The method integrates dual-path feature extraction to capture both local and global features, incorporates a channel-domain adaptive soft-thresholding mechanism to effectively suppress noise interference, and utilizes the Focal Loss function to enhance the model’s attention to hard-to-classify samples. To validate the proposed method, given the scarcity of diverse real-world transformer PD data, an experimental platform was utilized to generate and collect PD data by artificially simulating various discharge defect models, including tip discharge, surface discharge, air-gap discharge and floating discharge. Data diversity was then enhanced through sample augmentation and noise simulation, to minimize the gap between experimental data and real-world on-site data. Experimental results demonstrate that the proposed method achieves superior partial discharge recognition accuracy and strong noise robustness on the experimental dataset. For future work, it is essential to collect more real transformer PD data to further validate and strengthen the model’s generalization capability, thereby ensuring its robust performance and applicability in practical scenarios. Full article

Citrus diseases can lead to surface defects on citrus fruits, adversely affecting their quality. This study aims to accurately identify citrus defects against varying backgrounds by focusing on four types of diseases: citrus black spot, citrus canker, citrus greening, and citrus melanose. We propose an improved YOLOv10-based disease detection method that replaces the traditional convolutional layers in the Backbone network with LDConv to enhance feature extraction capabilities. Additionally, we introduce the GFPN module to strengthen multi-scale information interaction through cross-scale feature fusion, thereby improving detection accuracy for small-target diseases. The incorporation of the DAT mechanism is designed to achieve higher efficiency and accuracy in handling complex visual tasks. Furthermore, we integrate the AFPN module to enhance the model’s detection capability for targets of varying scales. Lastly, we employ the Slide Loss function to adaptively adjust sample weights, focusing on hard-to-detect samples such as blurred features and subtle lesions in citrus disease images, effectively alleviating issues related to sample imbalance. The experimental results indicate that the enhanced model YOLOv10-LGDA achieves impressive performance metrics in citrus disease detection, with accuracy, recall, mAP@50, and mAP@50:95 rates of 98.7%, 95.9%, 97.7%, and 94%, respectively. These results represent improvements of 4.2%, 3.8%, 4.5%, and 2.4% compared to the original YOLOv10 model. Furthermore, when compared to various other object detection algorithms, YOLOv10-LGDA demonstrates superior recognition accuracy, facilitating precise identification of citrus diseases. This advancement provides substantial technical support for enhancing the quality of citrus fruit and ensuring the sustainable development of the industry. Full article

Addressing the difficulties in identifying surface defects in steel and various industrial materials, including challenges in detection, low generalization, and poor robustness, as well as the shortcomings of existing algorithms for industrial applications, this paper presents the YOLO-LSDI algorithm for steel surface defect identification. First, the model integrates the Adaptive Multi-Scale Pooling–Fast (AMSPPF) module, an adaptive multi-scale pooling approach that improves the extraction of global semantic and local edge features. Second, the Deformable Spatial Attention Module (DSAM), a hybrid attention mechanism combining deformable and spatial attention, is introduced to enhance the network’s focus on defect-relevant regions under complex industrial backgrounds. Third, Linear Deformable Convolution (LDConv) replaces standard convolution to better adapt to the irregular shapes of defects while maintaining low computational cost. Finally, the Inner-Complete Intersection over Union (Inner-CIoU) loss function is adopted to improve localization accuracy and training stability. Experimental results on the NEU-DET dataset demonstrate a 5.8% improvement in the mAP@0.5, a 2.4% improvement in the mAP@0.5:0.95, and a 6.2% improvement in the F1-score compared to the YOLOv11n baseline, with GFLOPs reduced to 6.1 and inference speed reaching 162.1 frames per second (FPS). Evaluations on the GC10-DET dataset, APSPC dataset, and a PCB defect dataset further confirm the generalization capability of YOLO-LSDI, with mAP@0.5 improvements of 4.2%, 2.1%, and 3.1%, and corresponding mAP@0.5:0.95 improvements of 1.1%, 1.5%, and 1.3%, respectively. These results validate the effectiveness and practicality of the proposed model for real-time industrial defect-detection tasks. Full article

Surface defect detection in chips is crucial for ensuring product quality and reliability. This paper addresses the challenge of low identification accuracy in chip surface defect detection, which arises from the similarity of defect characteristics, small sizes, and significant scale differences. We propose an enhanced chip surface defect detection algorithm based on an improved version of YOLOv8, termed RST-YOLOv8. This study introduces the C2f_RVB module, which incorporates RepViTBlock technology. This integration effectively optimizes feature representation capabilities while significantly reducing the model’s parameter count. By enhancing the expressive power of deep features, we achieve a marked improvement in the identification accuracy of small defect targets. Additionally, we employ the SimAM attention mechanism, enabling the model to learn three-dimensional channel information, thereby strengthening its perception of defect characteristics. To address the issues of missed detections and false detections of small targets in chip surface defect detection, we designed a task-aligned dynamic detection head (TADDH) to facilitate interaction between the localization and classification detection heads. This design improves the accuracy of small target detection. Experimental evaluations on the PCB_DATASET indicate that our model improved the mAP@0.5 by 10.3%. Furthermore, significant progress was achieved in experiments on the chip surface defect dataset, where mAP@0.5 increased by 5.4%. Simultaneously, the model demonstrated significant advantages in terms of computational complexity, as both the number of parameters and GFLOPs were effectively controlled. This showcases the model’s balance between high precision and a lightweight design. The experimental results show that the RST-YOLOv8 model has a significant advantage in detection accuracy for chip surface defects compared to other models. It not only enhances detection accuracy but also achieves an optimal balance between computational resource consumption and real-time performance, providing an ideal technical pathway for chip surface defect detection tasks. Full article

The precise identification and non-destructive measurement of structural features and defects in semiconductor wafers are essential for ensuring process integrity and sustaining high yield in advanced manufacturing environments. Unlike conventional measurement techniques, scanning acoustic microscopy (SAM) is an advanced method that provides detailed visualizations of both surface and internal wafer structures. However, in practical industrial applications, the scanning time and image quality of SAM significantly impact its overall performance and utility. Prolonged scanning durations can lead to production bottlenecks, while suboptimal image quality can compromise the accuracy of defect detection. To address these challenges, this study proposes LinearTGAN, an improved generative adversarial network (GAN)-based model specifically designed to improve the resolution of linear acoustic wafer images acquired by the breakthrough rotary scanning acoustic microscopy (R-SAM) system. Empirical evaluations demonstrate that the proposed model significantly outperforms conventional GAN-based approaches, achieving a Peak Signal-to-Noise Ratio (PSNR) of 29.479 dB, a Structural Similarity Index Measure (SSIM) of 0.874, a Learned Perceptual Image Patch Similarity (LPIPS) of 0.095, and a Fréchet Inception Distance (FID) of 0.445. To assess the measurement aspect of LinearTGAN, a lightweight defect segmentation module was integrated and tested on annotated wafer datasets. The super-resolved images produced by LinearTGAN significantly enhanced segmentation accuracy and improved the sensitivity of microcrack detection. Furthermore, the deployment of LinearTGAN within the R-SAM system yielded a 92% improvement in scanning performance for 12-inch wafers while simultaneously enhancing image fidelity. The integration of super-resolution techniques into R-SAM significantly advances the precision, robustness, and efficiency of non-destructive measurements, highlighting their potential to have a transformative impact in semiconductor metrology and quality assurance. Full article

Additive manufacturing (AM) is widely used in industries such as aerospace, medical, and automotive. Within this domain, defect detection technology has emerged as a critical area of research focus in the quality inspection phase of AM. The main challenge lies in that under extreme lighting conditions, strong reflected light obscures defect feature information, leading to a significant decrease in the defect detection rate. This paper introduces a novel methodology for intelligent defect detection in AM components with reflective surfaces, leveraging virtual polarization filtering (IEVPF) and an improved YOLO V5-W model. The IEVPF algorithm is designed to enhance image quality through the virtual manipulation of light polarization, thereby improving defect visibility. The YOLO V5-W model, integrated with CBAM attention, DenseNet connections, and an EIoU loss function, demonstrates superior performance in defect identification across various lighting conditions. Experiments show a 40.3% reduction in loss, a 10.8% improvement in precision, a 10.3% improvement in recall, and a 13.7% improvement in mAP compared to the original YOLO V5 model. Our findings highlight the potential of combining virtual polarization filtering with advanced deep learning models for enhanced AM surface defect detection. Full article

Carbon-fiber-reinforced polymer (CFRP) preforms are vital for high-performance composite structures, yet the real-time detection of surface yarn alignment defects is hindered by complex textures. This study introduces a novel machine vision framework to enable the precise, real-time identification of such defects in CFRP preforms. We proposed obtaining the frequency spectrum by removing the zero-frequency component from the projection curve of images of carbon fiber fabric, aiding in the identification of the cycle number for warp and weft yarns. A texture structure recognition method based on the artistic conception drawing (ACD) revert is applied to distinguishing the complex and diverse surface texture of the woven carbon fabric prepreg from potential surface defects. Based on the linear discriminant analysis for defect area threshold extraction, a defect boundary tracking algorithm rule was developed to achieve defect localization. Using over 1500 images captured from actual production lines to validate and compare the performance, the proposed method significantly outperforms the other inspection approaches, achieving a 97.02% recognition rate with a 0.38 s per image processing time. This research contributes new scientific insights into the correlation between yarn alignment anomalies and a machine-vision-based texture analysis in CFRP preforms, potentially advancing our fundamental understanding of the defect mechanisms in composite materials and enabling data-driven quality control in advanced manufacturing. Full article

In the context of the rapid popularization of clean energy, the precise identification of surface defects on photovoltaic modules has become a core technical bottleneck limiting the operational efficiency of power stations. In response to the shortcomings of existing detection methods in identifying tiny defects and model efficiency, this study innovatively constructed the EER-DETR detection framework: firstly, a feature reconstruction module WDBB with a differentiable branch structure was introduced to significantly enhance the feature retention ability for fine cracks and other small targets; secondly, an adaptive feature pyramid network EHFPN was innovatively designed, which achieved efficient integration of multi-level features through a dynamic weight allocation mechanism, reducing the model complexity by 9.7% while maintaining detection accuracy, solving the industry problem of “precision—efficiency imbalance” in traditional feature pyramid networks; finally, an enhanced upsampling component was introduced to effectively address the problem of detail loss that occurs in traditional methods during image resolution enhancement. Experimental verification shows that the improved algorithm increased the average precision (mAP@0.5) on the panel dataset by 1.9%, and its comprehensive performance also exceeded RT-DETR. Based on the industry standard PVEL-AD, the detection rate of typical defects significantly improved compared to the baseline model. The core innovation of this research lies in the combination of differentiable architecture design and dynamic feature management, providing a detection tool for the intelligent operation and maintenance of photovoltaic power stations that possesses both high precision and lightweight characteristics. It has significant engineering application value and academic reference significance. Full article

An enhanced process for shaping thermoset fiber-reinforced composites using Modified Double-Diaphragm Forming (mDDF) in Prepreg Compression Molding (PCM) is proposed to address limitations in conventional forming quality. To minimize surface defects, prepregs were pre-cut to reduce wrinkle formation and trimmed after preforming. Complex geometries were managed through draping analysis, which enabled identification and mitigation of wrinkle-prone regions. A challenging layup configuration (±45/0/90/0/90/0/±45) was selected, and temperature-dependent behavior of the prepreg—such as resin fluidity and wrinkle characteristics—was evaluated from room temperature to 80 °C. Material characterization included tensile, bias extension, bending, friction, and density tests. Forming simulations using AniForm Suite 3.0 incorporated fitted material parameters for predictive analysis. Experimental validation confirmed that the mDDF process significantly improved fiber alignment and eliminated wrinkle defects, especially in 16 previously identified critical zones. The final parts exhibited superior surface quality and dimensional accuracy compared to conventional PCM, highlighting the potential of mDDF for precision manufacturing of complex thermoset composite structures. Full article

Aiming at the key technology of defect detection in precision additive manufacturing of highly reflective metal materials, this study proposes an enhanced SCK-YOLOV5 framework, which combines polarization imaging and deep learning methods to significantly improve the intelligent identification ability of small metal micro and nano defects. This framework introduces the SNWD (Selective Network with attention for Defect and Weathering Degradation) Loss function, which combines the SIOU Angle Loss with the NWD distribution sensing characteristics. It is specially designed for automatic positioning and identification of micrometer hole defects. At the same time, we employ global space construction with a dual-attention mechanism and multi-scale feature refining technique with selection kernel convolution to extract multi-scale defect information from highly reflective surfaces stably. Combined with the polarization imaging preprocessing and the comparison of enhancement defects under high reflectivity, the experimental results show that the proposed method significantly improves the precision, recall rate, and mAP50 index compared with the YOLOv5 baseline (increased by 0.5%, 1.2%, and 1.8%, respectively). It is the first time that this improvement has been achieved among the existing methods based on the YOLO framework. It creates a new paradigm for intelligent defect detection in additive manufacturing of high-precision metal materials and provides more reliable technical support for quality control in industrial manufacturing. Full article

The damaged and deformed fruits of fresh berries severely restrict the economic value of produce, and accurate identification and grading methods have become a global research hotspot. To address the challenges of rapid and accurate defect detection in intelligent cherry sorting systems, this study proposes an enhanced YOLOv8n-based framework for sweet cherry defect identification. First, the dilation-wise residual (DWR) module replaces the conventional C2f structure, allowing for the adaptive capture of both local and global features through multi-scale convolution. This enhances the recognition accuracy of subtle surface defects and large-scale damages on cherries. Second, a channel attention feature fusion mechanism (CAFM) is incorporated at the front end of the detection head, which enhances the model’s ability to identify fine defects on the cherry surface. Additionally, to improve bounding box regression accuracy, powerful-IoU (PIoU) replaces the traditional CIoU loss function. Finally, self-distillation technology is introduced to further improve the mode’s generalization capability and detection accuracy through knowledge transfer. Experimental results show that the YOLOv8-DCPF model achieves precision, mAP, recall, and F1 score rates of 92.6%, 91.2%, 89.4%, and 89.0%, respectively, representing improvements of 6.9%, 5.6%, 6.1%, and 5.0% over the original YOLOv8n baseline network. The proposed model demonstrates high accuracy in cherry defect detection, providing an efficient and precise solution for intelligent cherry sorting in agricultural engineering applications. Full article

Detecting partial discharges in cable joints is critical for timely defect identification and reliable transmission system operation. To improve the long-term reliability and sensitivity of the sensing system, a novel method for cable joint monitoring based on implanting optical fibers within the joint structure is proposed. The electric field distribution of the optical fiber-implanted cable joint was simulated, followed by electrical performance tests, demonstrating that optical fiber implantation had a negligible effect on the electrical properties of the cable joint. A platform utilizing Mach–Zehnder–Sagnac (MZ–Sagnac) interferometry was developed to evaluate the frequency response of the implanted optical fiber sensor, with calibration performed on a non-standard curved surface. The results show that the average sensitivity of the sensor in the 10 kHz–80 kHz range is 71.6 dB, 2.0 dB higher than that of the piezoelectric transducer, with a maximum signal-to-noise ratio of 65.2 dB. To simulate common fault conditions in the actual operation of cable joints, four types of discharge defects were introduced. Partial discharge tests conducted on an optical fiber-implanted cable joint, supplemented by measurements using a partial discharge detector, demonstrate that the optical fiber sensors can detect a minimum discharge of 16.0 pC. Full article

Syphilis is a disease caused by Treponema pallidum. It is primarily transmitted sexually or vertically during pregnancy. The origin is twofold, namely, it comes from America or Europe. Syphilis was first recorded in a human skeleton in the 11th century. However, signs of treponemal disease were observed in osteological material from a Pleistocene bear. Hence, it is necessary to study syphilis on bone material to better understand the etiology of the above disease and, consequently, introduce preventive measures. Examination of syphilis on skeletal material can be performed at the macroscopic and microscopic levels. Those methods refer to the visual assessment of skeletal material, namely the identification of characteristic pathological changes caused by syphilis, such as periostitis, which manifests itself as thickenings on the bone surface, and syphilis nodules (gummata), which are defects in the bones. Most often, these changes are found on long bones such as the tibia, femur, and skull. Radiological methods may be used, such as X-ray, computed tomography (CT), Micro-CT (ICT), as well as molecular examination. Summarizing, this review is an overview of the latest methodology regarding syphilis research on skeletal material, thanks to which it can better understand its genesis. Full article