A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy
AbstractIn this paper, a laboratory goniometer system for performing multi-angular measurements under controlled illumination conditions is described. A commercially available robotic arm enables the acquisition of a large number of measurements over the full hemisphere within a short time span making it much faster than other goniometers. In addition, the presented set-up enables assessment of anisotropic reflectance and emittance behaviour of soils, leaves and small canopies. Mounting a spectrometer enables acquisition of either hemispherical measurements or measurements in the horizontal plane. Mounting a thermal camera allows directional observations of the thermal emittance. This paper also presents three showcases of these different measurement set-ups in order to illustrate its possibilities. Finally, suggestions for applying this instrument and for future research directions are given, including linking the measured reflectance anisotropy with physically-based anisotropy models on the one hand and combining them with field goniometry measurements for joint analysis with remote sensing data on the other hand. The speed and flexibility of the system offer a large added value to the existing pool of laboratory goniometers.
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Roosjen, P.P.J.; Clevers, J.G.P.W.; Bartholomeus, H.M.; Schaepman, M.E.; Schaepman-Strub, G.; Jalink, H.; van der Schoor, R.; de Jong, A. A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy. Sensors 2012, 12, 17358-17371.
Roosjen PPJ, Clevers JGPW, Bartholomeus HM, Schaepman ME, Schaepman-Strub G, Jalink H, van der Schoor R, de Jong A. A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy. Sensors. 2012; 12(12):17358-17371.Chicago/Turabian Style
Roosjen, Peter P.J.; Clevers, Jan G.P.W.; Bartholomeus, Harm M.; Schaepman, Michael E.; Schaepman-Strub, Gabriela; Jalink, Henk; van der Schoor, Rob; de Jong, Arjan. 2012. "A Laboratory Goniometer System for Measuring Reflectance and Emittance Anisotropy." Sensors 12, no. 12: 17358-17371.