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Journal: Sensors, 2017
Volume: 17
Number: 2816

Article: A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel
Authors: by Seiji Takahashi, Yi-Min Huang, Jhy-Jyi Sze, Tung-Ting Wu, Fu-Sheng Guo, Wei-Cheng Hsu, Tung-Hsiung Tseng, King Liao, Chin-Chia Kuo, Tzu-Hsiang Chen, Wei-Chieh Chiang, Chun-Hao Chuang, Keng-Yu Chou, Chi-Hsien Chung, Kuo-Yu Chou, Chien-Hsien Tseng, Chuan-Joung Wang and Dun-Nien Yaung
Link: https://www.mdpi.com/1424-8220/17/12/2816

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