1. Introduction
Radio frequency circuits (RF circuits) refer to circuits that process signals with wavelengths that are on the same order of magnitude as the component size [
1] and are widely used in the commercial, civilian, and defense fields. However, due to their complex circuit structure and working environment, it is easy to encounter problems such as circuit performance degradation and system failure [
2,
3,
4,
5,
6]. When a failed RF circuit is in a personal mobile device, it can lead to poor personal communication, but when it is in a large system such as radar, a weapon, etc., it can cause a great loss of life and property.
Remaining useful life (RUL) is the amount of time a device can continue to operate safely within its expected lifespan [
7,
8,
9]. RUL prediction is an important part of Prognostics and Health Management (PHM). It can predict the failure time of equipment before it fails and prepare for shutdown and maintenance in advance. This can reduce redundant maintenance, lower maintenance costs, and effectively reduce the risk of catastrophic accidents and associated damage, greatly improving the reliability of the system. Therefore, it is extremely important to realize a highly accurate RUL prediction for RF circuits.
Commonly used RUL prediction methods fall into three main categories: model-driven approaches, data-driven approaches, and hybrid approaches combined the data-driven approaches and model-driven approaches.
Model-driven approaches often require a comprehensive understanding of the degradation mechanism of circuits, and they describe the physicochemical phenomena generated during the degradation of the circuit by modeling. Currently, limited by the complexity of circuit structures and the high difficulty of modeling, few people have conducted in-depth analyses of the degradation mechanism of a complete circuit. Many scholars are studying the degradation mechanism of commonly used devices in circuits. Yao Bo et al. [
10] studied the failure mechanism of AC filter capacitors, and the results showed that the typical precursor capacitance remained almost unchanged during the degradation process when the applied AC voltage varied within a certain range, and when the temperature rise reached 3–4 times the initial temperature rise, the AC capacitor rapidly failed within ten minutes. Due to the short failure time, it is almost impossible to realize an RUL prediction for AC filter capacitors. Yanjun Xu et al. [
11] concluded that current-induced electromigration (EM), and Ni diffusion to form porous holes, is the main reason for the EM failure of NiCu thin film, and realized their life prediction based on the experimental results.
The data-driven approaches are the mainstream method for researching RUL prediction in various fields at present. Without the need to study the complex degradation mechanism, a high-precision RUL prediction can be realized as long as there is enough data. The commonly used neural networks for RUL prediction are mainly the long short-term memory (LSTM) neural network [
12] and the gated recurrent unit (GRU) neural network [
13]. For example, Xiaowu Chen et al. [
8] proposed a degradation model based on the Wiener process, which was combined with the LSTM neural network to realize the RUL prediction of batteries. Li Biao et al. [
14] combined an attention mechanism and LSTM neural network to realize the RUL prediction of rolling bearings. Bing Long et al. [
13] used a GRU neural network to predict the RUL of a hydrogen–oxygen fuel cell. The LSTM neural network and GRU neural network come from the improvement of the recurrent neural network (RNN), which is a neural network specially used to deal with time series. The RNN thinks that there is a connection between each data point of the time series, and it can dig deep into the connection to realize the time series prediction with high accuracy.
Hybrid approaches are proposed in the hope of combining the advantages of both the model-driven approaches and data-driven approaches, and it is currently common to use data-driven approaches to create a state space mapped to a state space, and then use a sensor to measure the state space of the model, to model the evolutionary degradation state [
15]. For example, Jouin et al. [
16] proposed three empirical models, linear, logarithmic, and exponential, for the RUL prediction of fuel cells, where the parameters of the model were obtained by particle filtering, and then the parameter-updated empirical model was used to predict the aging trend of the voltage. Yu Zang et al. [
17] considered the lack of sufficient life cycle data for the D-type cables of high-speed railroad transmission equipment, and the lack of failure physical models, so they obtained the data from Ansys and used it to predict the aging trend of the voltage model; so, after obtaining the life cycle data through Ansys, the RUL of D-type cables was predicted using a hybrid of particle-filtering methods and the Paris–Laws model.
Considering the above three RUL prediction methods, the data-driven method is widely used in the PHM of circuits because of its low cost and there being no need to analyze the circuit degradation mechanism. However, most of the applications are for low-frequency analog circuits, while applications in the RF field focus on fault diagnosis. Convolutional neural networks (CNNs) show great potential in fault diagnosis and feature extraction. Kasem Khalil et al. [
18] implemented the early fault diagnosis of transistors based on an FFT, PCA, and CNN to detect aging, short circuit, and open circuit faults in transistors with high accuracy. Jiyuan Gao et al. [
19] used the enhanced golden eagle optimizer algorithm to optimize the 1-D CNN for the analog circuit fault diagnosis of a four-op-amp biquadratic filter circuit. Xinjia Yuan et al. [
20] proposed an analog fault diagnosis method based on tunable Q-factor wavelet transform (TQWT) and CNNs, using CNNs for feature extraction and fault diagnosis, which was verified on a second-order bandpass filter circuit.
However, the analysis and measurement of RF circuits is different from that of low-frequency analog circuits, and proprietary RUL prediction methods need to be established for RF circuits. In this manuscript, an RUL prediction method for RF circuits based on a data-driven approach is proposed. The research implications of this manuscript are summarized as follows:
(1) Application area: A complete methodology for solving RUL prediction for RF circuits is proposed in four parts—namely, the establishment of a feature matrix, circuit health state assessment, circuit lifecycle segmentation, and data-driven prediction methodology based on data—which contributes to the PHM of RF circuits.
(2) Prediction model: A novel RUL prediction method combined with a GRU and convolutional neural network (CNN) is proposed. Based on the spatiotemporal information of the feature matrix, the relevant temporal information is first extracted by the GRU and mapped to a 2D matrix, and then the CNN is utilized to complete the final prediction.
The structure of this manuscript is summarized below.
Section 2 describes how the simulation data are acquired and the hybrid health scores used to assess the health status.
Section 3 describes in detail the basic theory of CNN and GRU models and the proposed GRU-CNN method.
Section 4 gives the experimental results.
Section 5 summarizes all the work.
5. Conclusions
In this manuscript, a novel RUL prediction method for RF circuits based on the GRU-CNN model is proposed. Firstly, the data are normalized to limit all the data to the range of 0–1, which improves the processing efficiency of the model. Secondly, the degradation trends of eight feature parameters of RF circuits at 11 frequencies are integrated, using the hybrid health scores calculated based on the Manhattan distance and Euclidean distance. Then the life cycle of RF circuits is segmented into the normal working stage, slow degradation stage, and accelerated degradation stage based on the hybrid health scores. Finally, after reasonably analyzing the life cycle of RF circuits, the normal operation stage and slow degradation stage are selected for applying the GRU-CNN model proposed in this manuscript for prediction. Compared with the GRU model and CNN model, our proposed GRU-CNN model is more advantageous. The following conclusions can be drawn:
(1) The GRU-CNN model utilizes the GRU model to extract the features of the data in time, and then the CNN is used to process the features in space, which makes full use of the spatiotemporal dependence of the data. The prediction accuracies in both the normal working stage and the slow degradation stage of the RF circuit are higher than those of the GRU model and the CNN model.
(2) The temporal features extracted by the GRU model can constrain the prediction results within a range, avoiding prediction results with particularly large errors. Therefore, the prediction uncertainty of the GRU-CNN model in the normal working stage and the slow degradation stage of the RF circuit is much smaller than that of the CNN model.