Metrology for IoT and Industrial IoT

Dear Colleagues,

This Special Issue is about the reciprocal influence that metrology has on the development of IoT systems and, vice versa, the new opportunities offered by IoT have on the development of new measurement methods and instruments.

The invited contributions are expected to include scientists active in developing instrumentation and measurement methods for IoT and Industrial IoT (including Industry 4.0), new technologies for metrology-assisted production, component measurement, sensors, and associated signal conditioning, and calibration methods for distributed electronic tests.

Although there are similarities between IoT for general systems and industrial systems (e.g., scalability), there are significant differences because industrial systems must have low latencies, critical missions, high predictability, and resilience to failures. Hence, there is justification for having some distinction between IoT measurement systems and Industrial IoT applications (including Industry 4.0).

The session will bring together all the innovative ideas and technologies about measurement challenges in the IoT era, ranging from system architecture, uncertainty analysis, and applications with the aim of increasing the pervasiveness of IoT solutions.

Submissions are welcomed on (but not limited to):

• Distributed measurement systems based on IoT infrastructure;
• Architectures for robust and predictable measurement systems in IoT and Industrial IoT applications;
• Uncertainty propagation in measurement systems for IoT and Industrial IoT;
• IoT wireless technologies applied to measurement systems;
• Inclusion of heterogeneous network technologies into IoT-based measurement systems;
• Machine-to-machine (M2M) communication, including wire and wireless communications;
• Fault-tolerant measurement systems based on IoT paradigms;
• IoT measurement systems for energy storage solutions with larger energetic density, faster and more secure response time, and smaller heat emission;
• Security of measurement systems with IoT-enabled interfaces;
• Enabling of predictive maintenance by means of Industrial IoT-based measurement systems;
• Efficient design and implementation of virtual measurement systems in terms of timing and uncertainty constraints;
• Allocation of measurement tasks and algorithms at different infrastructure levels including edge, fog, and cloud computing;
• Increasing of the effectiveness of measurement result presentation by means of cloud based infrastructure;
• Supporting service level virtualization for distributed measurement systems in an industrial context;
• Localization Technologies for the IoT scenario;
• Digital twins for metrology—development and application of virtual models of products, processes or services;
• Virtual reality, augmented reality, and mixed reality theory and applications to IoT measurement systems in industry;
• Applied and industrial metrology, including mutual recognition, accreditation, and peer review tools in the field of Industry 4.0;
• Case studies of IoT and Industrial IoT measurement systems.

Prof. Dr. Paolo Ferrari
Prof. Dr. Raphael Machado
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• IoT measurement system
• IoT instrument architecture
• fault-tolerant IoT sensors
• uncertainty of IoT measures
• Industry 4.0 measurements
• applied and industrial metrology in IoT
• security of IoT instruments
• wireless for IoT measurement devices
• digital twin and measurements
• edge, fog, and cloud measurement algorithms