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Journal: Sensors, 2019
Volume: 19
Number: 5447
Article:
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors
Authors:
by
Calvin Yi-Ping Chao, Shang-Fu Yeh, Meng-Hsu Wu, Kuo-Yu Chou, Honyih Tu, Chih-Lin Lee, Chin Yin, Philippe Paillet and Vincent Goiffon
Link:
https://www.mdpi.com/1424-8220/19/24/5447
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