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Journal: Sensors, 2019
Volume: 19
Number: 2056

Article: Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs
Authors: by Corinna Kofler, Robert Muhr and Gunter Spöck
Link: https://www.mdpi.com/1424-8220/19/9/2056

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