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Journal: Sensors, 2020
Volume: 20
Number: 5481
Article:
Deep Quality Assessment of a Solar Reflector Based on Synthetic Data: Detecting Surficial Defects from Manufacturing and Use Phase
Authors:
by
Alexios Papacharalampopoulos, Konstantinos Tzimanis, Kyriakos Sabatakakis and Panagiotis Stavropoulos
Link:
https://www.mdpi.com/1424-8220/20/19/5481
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