Method to Determine the Far-Field Beam Pattern of A Long Array From Subarray Beam Pattern Measurements
Abstract
:1. Introduction
2. Materials and Methods
2.1. Beam Pattern
2.2. Proposed Measurement Method
3. Results and Discussion
3.1. Simulation
3.2. Near-Field Measurement Experiments
4. Discussion
5. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Jung, D.; Kim, J. Method to Determine the Far-Field Beam Pattern of A Long Array From Subarray Beam Pattern Measurements. Sensors 2020, 20, 1236. https://doi.org/10.3390/s20041236
Jung D, Kim J. Method to Determine the Far-Field Beam Pattern of A Long Array From Subarray Beam Pattern Measurements. Sensors. 2020; 20(4):1236. https://doi.org/10.3390/s20041236
Chicago/Turabian StyleJung, Donghwan, and Jeasoo Kim. 2020. "Method to Determine the Far-Field Beam Pattern of A Long Array From Subarray Beam Pattern Measurements" Sensors 20, no. 4: 1236. https://doi.org/10.3390/s20041236