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Journal: Sensors, 2021
Volume: 21
Number: 4014

Article: An Ultrafast Active Quenching Active Reset Circuit with 50% SPAD Afterpulsing Reduction in a 28 nm FD-SOI CMOS Technology Using Body Biasing Technique
Authors: by Mohammadreza Dolatpoor Lakeh, Jean-Baptiste Kammerer, Enagnon Aguénounon, Dylan Issartel, Jean-Baptiste Schell, Sven Rink, Andreia Cathelin, Francis Calmon and Wilfried Uhring
Link: https://www.mdpi.com/1424-8220/21/12/4014

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