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Journal: Sensors, 2021
Volume: 21
Number: 5627
Article:
Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests
Authors:
by
Fabio Principato, Giuseppe Allegra, Corrado Cappello, Olivier Crepel, Nicola Nicosia, Salvatore D′Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello and Francesco Pintacuda
Link:
https://www.mdpi.com/1424-8220/21/16/5627
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