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Journal: Sensors, 2021
Volume: 21
Number: 2010

Article: Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS)
Authors: by Isotta Cainero, Elena Cerutti, Mario Faretta, Gaetano Ivan Dellino, Pier Giuseppe Pelicci, Alberto Diaspro and Luca Lanzanò
Link: https://www.mdpi.com/1424-8220/21/6/2010

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