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Journal: Sensors, 2024
Volume: 24
Number: 5649
5649
Article: Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties
Authors: by Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski and Teodor Gotszalk
Link: https://www.mdpi.com/1424-8220/24/17/5649

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