Nakamura, N.;                     Szypryt, P.;                     Dagel, A.L.;                     Alpert, B.K.;                     Bennett, D.A.;                     Doriese, W.B.;                     Durkin, M.;                     Fowler, J.W.;                     Fox, D.T.;                     Gard, J.D.;     
    et al.    Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. Sensors 2024, 24, 2890.
    https://doi.org/10.3390/s24092890
    AMA Style
    
                                Nakamura N,                                 Szypryt P,                                 Dagel AL,                                 Alpert BK,                                 Bennett DA,                                 Doriese WB,                                 Durkin M,                                 Fowler JW,                                 Fox DT,                                 Gard JD,         
        et al.        Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. Sensors. 2024; 24(9):2890.
        https://doi.org/10.3390/s24092890
    
    Chicago/Turabian Style
    
                                Nakamura, Nathan,                                 Paul Szypryt,                                 Amber L. Dagel,                                 Bradley K. Alpert,                                 Douglas A. Bennett,                                 William Bertrand Doriese,                                 Malcolm Durkin,                                 Joseph W. Fowler,                                 Dylan T. Fox,                                 Johnathon D. Gard,         
         and et al.        2024. "Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer" Sensors 24, no. 9: 2890.
        https://doi.org/10.3390/s24092890
    
    APA Style
    
                                Nakamura, N.,                                 Szypryt, P.,                                 Dagel, A. L.,                                 Alpert, B. K.,                                 Bennett, D. A.,                                 Doriese, W. B.,                                 Durkin, M.,                                 Fowler, J. W.,                                 Fox, D. T.,                                 Gard, J. D.,                                 Goodner, R. N.,                                 Harris, J. Z.,                                 Hilton, G. C.,                                 Jimenez, E. S.,                                 Kernen, B. L.,                                 Larson, K. W.,                                 Levine, Z. H.,                                 McArthur, D.,                                 Morgan, K. M.,         
                                            ... Swetz, D. S.        
        (2024). Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. Sensors, 24(9), 2890.
        https://doi.org/10.3390/s24092890